Investigation and analysis of LM124 bipolar linear circuitry response phenomenon in pulsed X-ray environment

Nicolas J.H. Roche, L. Dusseau, J. R. Vaillé, J. Mekki, Y. Gonzalez Velo, S. Perez, J. Boch, F. Saigné, R. Marec, P. Calvel, F. Bezerra, G. Auriel, B. Azaïs

Research output: Contribution to journalArticle

21 Scopus citations

Abstract

Analog Transient Radiation Effects in Electronics (ATREE) induced by high dose-rate X-ray pulses are investigated using a flash X-ray facility. The ATREEs induced in a LM124 operational amplifier configured in three different bias configurations are investigated. A predictive methodology, based upon a previously developed ASET simulation tool, is used to model the ATREE phenomena. A semiempirical physical model is used to perform the correlation between the duration of the parasitic pulse signal induced in the LM124 and an equivalent value of the high dose-rate X-ray pulse level.

Original languageEnglish (US)
Article number5658011
Pages (from-to)3392-3399
Number of pages8
JournalIEEE Transactions on Nuclear Science
Volume57
Issue number6 PART 1
DOIs
StatePublished - Dec 1 2010

Keywords

  • Bipolar analog integrated circuits
  • integrated circuit modeling
  • ionizing dose
  • single event transient
  • transient propagation
  • transient response

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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    Roche, N. J. H., Dusseau, L., Vaillé, J. R., Mekki, J., Velo, Y. G., Perez, S., Boch, J., Saigné, F., Marec, R., Calvel, P., Bezerra, F., Auriel, G., & Azaïs, B. (2010). Investigation and analysis of LM124 bipolar linear circuitry response phenomenon in pulsed X-ray environment. IEEE Transactions on Nuclear Science, 57(6 PART 1), 3392-3399. [5658011]. https://doi.org/10.1109/TNS.2010.2089063