Abstract

The scaling of CMOS technology to the nanometer regime inevitability increases reliability concerns, profoundly impacting all aspects of circuit performance and posing a fundamental challenge to future IC design. These reliability concerns arise from many different sources, and become more severe with continuous scaling.

Original languageEnglish (US)
Title of host publicationCircuit Design for Reliability
PublisherSpringer New York
Pages1-4
Number of pages4
ISBN (Print)9781461440789, 9781461440772
DOIs
StatePublished - Jan 1 2015

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Reis, R., Cao, Y., & Wirth, G. (2015). Introduction. In Circuit Design for Reliability (pp. 1-4). Springer New York. https://doi.org/10.1007/978-1-4614-4078-9_1