Intrinsic variability in nano-CMOS design and beyond

Yu Cao, Chi Chao Wang, Yun Ye, Samatha Gummalla, Chaitali Chakrabarti

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publication2010 IEEE International Electron Devices Meeting, IEDM 2010
Pages17.5.1
DOIs
StatePublished - Dec 1 2010
Event2010 IEEE International Electron Devices Meeting, IEDM 2010 - San Francisco, CA, United States
Duration: Dec 6 2010Dec 8 2010

Publication series

NameTechnical Digest - International Electron Devices Meeting, IEDM
ISSN (Print)0163-1918

Other

Other2010 IEEE International Electron Devices Meeting, IEDM 2010
CountryUnited States
CitySan Francisco, CA
Period12/6/1012/8/10

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

Cite this

Cao, Y., Wang, C. C., Ye, Y., Gummalla, S., & Chakrabarti, C. (2010). Intrinsic variability in nano-CMOS design and beyond. In 2010 IEEE International Electron Devices Meeting, IEDM 2010 (pp. 17.5.1). [5703382] (Technical Digest - International Electron Devices Meeting, IEDM). https://doi.org/10.1109/IEDM.2010.5703382