Intrinsic variability in nano-CMOS design and beyond

Yu Cao, Chi Chao Wang, Yun Ye, Samatha Gummalla, Chaitali Chakrabarti

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationTechnical Digest - International Electron Devices Meeting, IEDM
DOIs
StatePublished - 2010
Event2010 IEEE International Electron Devices Meeting, IEDM 2010 - San Francisco, CA, United States
Duration: Dec 6 2010Dec 8 2010

Other

Other2010 IEEE International Electron Devices Meeting, IEDM 2010
CountryUnited States
CitySan Francisco, CA
Period12/6/1012/8/10

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CMOS

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry

Cite this

Cao, Y., Wang, C. C., Ye, Y., Gummalla, S., & Chakrabarti, C. (2010). Intrinsic variability in nano-CMOS design and beyond. In Technical Digest - International Electron Devices Meeting, IEDM [5703382] https://doi.org/10.1109/IEDM.2010.5703382

Intrinsic variability in nano-CMOS design and beyond. / Cao, Yu; Wang, Chi Chao; Ye, Yun; Gummalla, Samatha; Chakrabarti, Chaitali.

Technical Digest - International Electron Devices Meeting, IEDM. 2010. 5703382.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Cao, Y, Wang, CC, Ye, Y, Gummalla, S & Chakrabarti, C 2010, Intrinsic variability in nano-CMOS design and beyond. in Technical Digest - International Electron Devices Meeting, IEDM., 5703382, 2010 IEEE International Electron Devices Meeting, IEDM 2010, San Francisco, CA, United States, 12/6/10. https://doi.org/10.1109/IEDM.2010.5703382
Cao Y, Wang CC, Ye Y, Gummalla S, Chakrabarti C. Intrinsic variability in nano-CMOS design and beyond. In Technical Digest - International Electron Devices Meeting, IEDM. 2010. 5703382 https://doi.org/10.1109/IEDM.2010.5703382
Cao, Yu ; Wang, Chi Chao ; Ye, Yun ; Gummalla, Samatha ; Chakrabarti, Chaitali. / Intrinsic variability in nano-CMOS design and beyond. Technical Digest - International Electron Devices Meeting, IEDM. 2010.
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