Intrinsic variability in nano-CMOS design and beyond

Yu Cao; Chi Chao Wang; Yun Ye; Samatha Gummalla; Chaitali Chakrabarti

doi:10.1109/IEDM.2010.5703382

Intrinsic variability in nano-CMOS design and beyond

Yu Cao, Chi Chao Wang, Yun Ye, Samatha Gummalla, Chaitali Chakrabarti

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	2010 IEEE International Electron Devices Meeting, IEDM 2010
Pages	17.5.1
DOIs	https://doi.org/10.1109/IEDM.2010.5703382
State	Published - 2010
Event	2010 IEEE International Electron Devices Meeting, IEDM 2010 - San Francisco, CA, United States Duration: Dec 6 2010 → Dec 8 2010

Publication series

Name	Technical Digest - International Electron Devices Meeting, IEDM
ISSN (Print)	0163-1918

Other

Other	2010 IEEE International Electron Devices Meeting, IEDM 2010
Country/Territory	United States
City	San Francisco, CA
Period	12/6/10 → 12/8/10

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

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10.1109/IEDM.2010.5703382

Cite this

Cao, Y, Wang, CC, Ye, Y, Gummalla, S & Chakrabarti, C 2010, Intrinsic variability in nano-CMOS design and beyond. in 2010 IEEE International Electron Devices Meeting, IEDM 2010., 5703382, Technical Digest - International Electron Devices Meeting, IEDM, pp. 17.5.1, 2010 IEEE International Electron Devices Meeting, IEDM 2010, San Francisco, CA, United States, 12/6/10. https://doi.org/10.1109/IEDM.2010.5703382

@inproceedings{28bd3d35dee7417281f60d691a21cd1b,

title = "Intrinsic variability in nano-CMOS design and beyond",

author = "Yu Cao and Wang, {Chi Chao} and Yun Ye and Samatha Gummalla and Chaitali Chakrabarti",

year = "2010",

doi = "10.1109/IEDM.2010.5703382",

language = "English (US)",

isbn = "9781424474196",

series = "Technical Digest - International Electron Devices Meeting, IEDM",

pages = "17.5.1",

booktitle = "2010 IEEE International Electron Devices Meeting, IEDM 2010",

note = "2010 IEEE International Electron Devices Meeting, IEDM 2010 ; Conference date: 06-12-2010 Through 08-12-2010",

}

TY - GEN

T1 - Intrinsic variability in nano-CMOS design and beyond

AU - Cao, Yu

AU - Wang, Chi Chao

AU - Ye, Yun

AU - Gummalla, Samatha

AU - Chakrabarti, Chaitali

PY - 2010

Y1 - 2010

UR - http://www.scopus.com/inward/record.url?scp=79951848756&partnerID=8YFLogxK

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U2 - 10.1109/IEDM.2010.5703382

DO - 10.1109/IEDM.2010.5703382

M3 - Conference contribution

AN - SCOPUS:79951848756

SN - 9781424474196

T3 - Technical Digest - International Electron Devices Meeting, IEDM

SP - 17.5.1

BT - 2010 IEEE International Electron Devices Meeting, IEDM 2010

T2 - 2010 IEEE International Electron Devices Meeting, IEDM 2010

Y2 - 6 December 2010 through 8 December 2010

ER -

Intrinsic variability in nano-CMOS design and beyond

Publication series

Other

ASJC Scopus subject areas

Access to Document

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