TY - GEN
T1 - Interrelation between Encapsulant Browning and Metallization Degradation
T2 - 48th IEEE Photovoltaic Specialists Conference, PVSC 2021
AU - Li, Fang
AU - Gopakumar, Abhijit
AU - Tatapudi, Sai Ravi
AU - Davis, Kristopher O.
AU - Tamizhmani, Govinda Samy
N1 - Funding Information:
This material is based upon work supported by the Department of Energy, Office of Energy Efficiency and Renewable Energy (EERE), under Award Number DE-EE0008155.
Publisher Copyright:
© 2021 IEEE.
PY - 2021/6/20
Y1 - 2021/6/20
N2 - Solar cell simulation has increasingly been used to investigate the field degradation mechanisms of photovoltaic modules. In this study, we investigate the interrelation between encapsulant browning and metallization degradation using various experimental data and solar cell simulation tools. This investigation is based on a bare cell extracted from a field-aged commercial module having encapsulant browning. The experimental data include dark I-V, light I-V, TLM and PL, EL and EDS images. Griddler was used as the primary simulation tool. This work demonstrates that a strong match (within 2.25% deviation) can be established between the simulated data by accounting for spatially resolved resistance parameters (contact resistance and grid line resistance) of metallization and the experimental data obtained in the browned encapsulant region of the solar cell.
AB - Solar cell simulation has increasingly been used to investigate the field degradation mechanisms of photovoltaic modules. In this study, we investigate the interrelation between encapsulant browning and metallization degradation using various experimental data and solar cell simulation tools. This investigation is based on a bare cell extracted from a field-aged commercial module having encapsulant browning. The experimental data include dark I-V, light I-V, TLM and PL, EL and EDS images. Griddler was used as the primary simulation tool. This work demonstrates that a strong match (within 2.25% deviation) can be established between the simulated data by accounting for spatially resolved resistance parameters (contact resistance and grid line resistance) of metallization and the experimental data obtained in the browned encapsulant region of the solar cell.
KW - Griddler
KW - contact resistance
KW - double-diode model
KW - encapsulant browning
KW - simulation
UR - http://www.scopus.com/inward/record.url?scp=85115945486&partnerID=8YFLogxK
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U2 - 10.1109/PVSC43889.2021.9518977
DO - 10.1109/PVSC43889.2021.9518977
M3 - Conference contribution
AN - SCOPUS:85115945486
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 1716
EP - 1720
BT - 2021 IEEE 48th Photovoltaic Specialists Conference, PVSC 2021
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 20 June 2021 through 25 June 2021
ER -