Abstract
A controversial pre-edge peak has often been observed at the O K-edge in absorption spectra from complex oxides. We study this feature in both K 2O-SiO2 glass and MgAl2O4 spinel crystals. Our time-resolved energy-loss spectroscopy (EELS) results indicate that the pre-edge peak is due to radiation damage, rather than from any intrinsic feature of the material. It is assigned to the π* peak due to the O-O interaction.
Original language | English (US) |
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Pages (from-to) | 215-219 |
Number of pages | 5 |
Journal | Ultramicroscopy |
Volume | 106 |
Issue number | 3 |
DOIs | |
State | Published - Feb 2006 |
Keywords
- Ceramics and refractories
- Electron and positron radiation effects
- Electron energy loss spectroscopy
- Glasses
- KO-SiO
- MgAl O
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation