Interpretation of O K-edge EELS in zircon using a structural variation approach

Nan Jiang, John Spence

Research output: Contribution to journalArticle

1 Scopus citations

Abstract

This work describes an approach to interpret the near-edge fine structure of electron energy-loss spectroscopy (EELS) of O K-edge in zircon using a structural variation method. The positions and intensities of several peaks in the O K-edge EELS spectrum are assigned to specific structural parameters. It suggests that the near-edge structures in EELS can be used to measure atomic structure changes.

Original languageEnglish (US)
Pages (from-to)89-93
Number of pages5
JournalUltramicroscopy
Volume110
Issue number1
DOIs
StatePublished - Jan 1 2009

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Keywords

  • EELS
  • O K-edge
  • Structural variation
  • Zircon

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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