Collection of 37 papers by various authors. The topics discussed are; tests generation and diagnosis, fault-location and testing, diagnosis and testing, reliability modeling and analysis, architecture and design, error protection and recovery, and software reliability. Following is a list of the titles and authors. On the Design of Minimum Length Fault Tests for Combinational Circuits. By L. W. Bearnson and C. C. Carroll. Algorithms for Detection of Faults in Logic Circuits. By W. G. Bouricius, E. P. Hsieh, G. R. Putzolu, J. P. Roth, P. R. Schneider and C. J. Tan. Boolean Difference for Fault-Detection in Asynchronous Sequential Machines. By M. Y. Hsiao and D. K. Chia. Efficient Algorithm for Generating Complete Test Sets for Combinational Logic Circuits. By S. S. Yau and Y. S Tang. Generation of Fault Detection Tests for Sequential Circuits. By M. A. Breuer. Diagnosable Machine Realizations of Sequential Behavior. By J. F. Meyer and K. Yeh.
|Original language||English (US)|
|Title of host publication||Unknown Host Publication Title|
|State||Published - 1800|
ASJC Scopus subject areas