Interlaboratory study to determine repeatability of the damp-heat test method for potential-induced degradation and polarization in crystalline silicon photovoltaic modules

Peter Hacke, Kent Terwilliger, Stephen Glick, Govindasamy Tamizhmani, Sai Tatapudi, Cameron Stark, Simon Koch, Thomas Weber, Juliane Berghold, Stephan Hoffmann, Michael Koehl, Sascha Dietrich, Matthias Ebert, Gerhard Mathiak

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

To test reproducibility of a technical specification under development for potential-induced degradation (PID) and polarization, three crystalline silicon module types were distributed in five replicas each to five laboratories. Stress tests were performed in environmental chambers at 60 °C, 85% relative humidity, 96 h, and with module nameplate system voltage applied. Results from the modules tested indicate that the test protocol can discern susceptibility to PID according to the pass/fail criteria with acceptable consistency from lab to lab; however, areas for improvement are indicated to achieve better uniformity in temperature and humidity on the module surfaces. In the analysis of variance of the results, 6% of the variance was attributed to laboratory influence, 34% to module design, and 60% to variability in test results within a given design. Testing with the additional factor of illumination with ultraviolet light slowed or arrested the degradation. Testing at 25 °C with aluminum foil as the module ground was also examined for comparison. The foil, as tested, did not itself achieve consistent contact to ground at all surfaces, but methods to ensure more consistent grounding were found and proposed. The rates of degradation in each test are compared, and details affecting the rates are discussed.

Original languageEnglish (US)
Article number6960016
Pages (from-to)94-101
Number of pages8
JournalIEEE Journal of Photovoltaics
Volume5
Issue number1
DOIs
StatePublished - Jan 1 2015

Fingerprint

high temperature tests
Silicon
modules
Polarization
degradation
Crystalline materials
Degradation
silicon
polarization
Atmospheric humidity
Nameplates
Environmental chambers
Aluminum foil
Testing
Electric grounding
Analysis of variance (ANOVA)
humidity
foils
Metal foil
Lighting

Keywords

  • High voltage techniques
  • photovoltaic systems
  • solar energy

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Interlaboratory study to determine repeatability of the damp-heat test method for potential-induced degradation and polarization in crystalline silicon photovoltaic modules. / Hacke, Peter; Terwilliger, Kent; Glick, Stephen; Tamizhmani, Govindasamy; Tatapudi, Sai; Stark, Cameron; Koch, Simon; Weber, Thomas; Berghold, Juliane; Hoffmann, Stephan; Koehl, Michael; Dietrich, Sascha; Ebert, Matthias; Mathiak, Gerhard.

In: IEEE Journal of Photovoltaics, Vol. 5, No. 1, 6960016, 01.01.2015, p. 94-101.

Research output: Contribution to journalArticle

Hacke, P, Terwilliger, K, Glick, S, Tamizhmani, G, Tatapudi, S, Stark, C, Koch, S, Weber, T, Berghold, J, Hoffmann, S, Koehl, M, Dietrich, S, Ebert, M & Mathiak, G 2015, 'Interlaboratory study to determine repeatability of the damp-heat test method for potential-induced degradation and polarization in crystalline silicon photovoltaic modules', IEEE Journal of Photovoltaics, vol. 5, no. 1, 6960016, pp. 94-101. https://doi.org/10.1109/JPHOTOV.2014.2361650
Hacke, Peter ; Terwilliger, Kent ; Glick, Stephen ; Tamizhmani, Govindasamy ; Tatapudi, Sai ; Stark, Cameron ; Koch, Simon ; Weber, Thomas ; Berghold, Juliane ; Hoffmann, Stephan ; Koehl, Michael ; Dietrich, Sascha ; Ebert, Matthias ; Mathiak, Gerhard. / Interlaboratory study to determine repeatability of the damp-heat test method for potential-induced degradation and polarization in crystalline silicon photovoltaic modules. In: IEEE Journal of Photovoltaics. 2015 ; Vol. 5, No. 1. pp. 94-101.
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