Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime

Adrienne L. Blum, James S. Swirhun, Ronald A. Sinton, Fei Yan, Stanislau Herasimenka, Thomas Roth, Kevin Lauer, Jonas Haunschild, Bianca Lim, Karsten Bothe, Ziv Hameiri, Bjoern Seipel, Rentian Xiong, Marwan Dhamrin, John D. Murphy

Research output: Contribution to journalArticlepeer-review

37 Scopus citations

Abstract

Excess-carrier recombination lifetime is a key parameter in silicon solar cell design and production. With the vast international use and recent standardization (SEMI PV13) of eddy-current wafer and brick silicon lifetime test instruments, it is important to quantify the inter-and intralaboratory repeatability. This paper presents the results of an international interlaboratory study conducted with 24 participants to determine the precision of the SEMI PV13 eddy-current carrier lifetime measurement test method. Overall, the carrier recombination lifetime between-laboratory reproducibility was found to be within ±11% for the quasi-steady-state mode and ±8% for transient mode for wafer samples, and within ±4% for bulk samples.

Original languageEnglish (US)
Article number6631475
Pages (from-to)525-531
Number of pages7
JournalIEEE Journal of Photovoltaics
Volume4
Issue number1
DOIs
StatePublished - Jan 2014

Keywords

  • Charge carrier lifetime
  • eddy currents
  • photoconductivity
  • silicon

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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