Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime

Adrienne L. Blum, James S. Swirhun, Ronald A. Sinton, Fei Yan, Stanislau Herasimenka, Thomas Roth, Kevin Lauer, Jonas Haunschild, Bianca Lim, Karsten Bothe, Ziv Hameiri, Bjoern Seipel, Rentian Xiong, Marwan Dhamrin, John D. Murphy

Research output: Contribution to journalArticle

33 Citations (Scopus)

Abstract

Excess-carrier recombination lifetime is a key parameter in silicon solar cell design and production. With the vast international use and recent standardization (SEMI PV13) of eddy-current wafer and brick silicon lifetime test instruments, it is important to quantify the inter-and intralaboratory repeatability. This paper presents the results of an international interlaboratory study conducted with 24 participants to determine the precision of the SEMI PV13 eddy-current carrier lifetime measurement test method. Overall, the carrier recombination lifetime between-laboratory reproducibility was found to be within ±11% for the quasi-steady-state mode and ±8% for transient mode for wafer samples, and within ±4% for bulk samples.

Original languageEnglish (US)
Article number6631475
Pages (from-to)525-531
Number of pages7
JournalIEEE Journal of Photovoltaics
Volume4
Issue number1
DOIs
StatePublished - Jan 1 2014

Fingerprint

Electric current measurement
Eddy currents
eddy currents
life (durability)
Carrier lifetime
Silicon solar cells
Silicon
Brick
wafers
Standardization
quasi-steady states
bricks
standardization
carrier lifetime
solar cells
silicon

Keywords

  • Charge carrier lifetime
  • eddy currents
  • photoconductivity
  • silicon

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime. / Blum, Adrienne L.; Swirhun, James S.; Sinton, Ronald A.; Yan, Fei; Herasimenka, Stanislau; Roth, Thomas; Lauer, Kevin; Haunschild, Jonas; Lim, Bianca; Bothe, Karsten; Hameiri, Ziv; Seipel, Bjoern; Xiong, Rentian; Dhamrin, Marwan; Murphy, John D.

In: IEEE Journal of Photovoltaics, Vol. 4, No. 1, 6631475, 01.01.2014, p. 525-531.

Research output: Contribution to journalArticle

Blum, AL, Swirhun, JS, Sinton, RA, Yan, F, Herasimenka, S, Roth, T, Lauer, K, Haunschild, J, Lim, B, Bothe, K, Hameiri, Z, Seipel, B, Xiong, R, Dhamrin, M & Murphy, JD 2014, 'Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime', IEEE Journal of Photovoltaics, vol. 4, no. 1, 6631475, pp. 525-531. https://doi.org/10.1109/JPHOTOV.2013.2284375
Blum, Adrienne L. ; Swirhun, James S. ; Sinton, Ronald A. ; Yan, Fei ; Herasimenka, Stanislau ; Roth, Thomas ; Lauer, Kevin ; Haunschild, Jonas ; Lim, Bianca ; Bothe, Karsten ; Hameiri, Ziv ; Seipel, Bjoern ; Xiong, Rentian ; Dhamrin, Marwan ; Murphy, John D. / Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime. In: IEEE Journal of Photovoltaics. 2014 ; Vol. 4, No. 1. pp. 525-531.
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