Interference-enhanced raman scattering of very thin titanium and titanium oxide films

Robert Nemanich, C. C. Tsai, G. A N Connell

Research output: Contribution to journalArticle

100 Citations (Scopus)

Abstract

The Raman spectra of very thin evaporated films (6 nm thick) of metallic titanium and oxidized titanium are obtained with a new technique called interference-enhanced Raman scattering. The results indicate that titanium films exhibit a crystalline hcp structure while the titanium oxide has an amorphous structure with local atomic bonding configurations similar to those in crystalline Ti2O3.

Original languageEnglish (US)
Pages (from-to)273-276
Number of pages4
JournalPhysical Review Letters
Volume44
Issue number4
DOIs
StatePublished - 1980
Externally publishedYes

Fingerprint

titanium oxides
oxide films
titanium
Raman spectra
interference
thin films
configurations

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Interference-enhanced raman scattering of very thin titanium and titanium oxide films. / Nemanich, Robert; Tsai, C. C.; Connell, G. A N.

In: Physical Review Letters, Vol. 44, No. 4, 1980, p. 273-276.

Research output: Contribution to journalArticle

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