Interference enhanced Raman scattering from very thin absorbing films

G. A.N. Connell; R. J. Nemanich; C. C. Tsai

doi:10.1063/1.91304

Interference enhanced Raman scattering from very thin absorbing films

G. A.N. Connell, R. J. Nemanich, C. C. Tsai

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128 Scopus citations

Abstract

A new method of obtaining Raman spectra from a very thin highly absorbing films (α≳10⁵ cm^-1) is described. The technique which is termed interference enhanced Raman scattering (IERS) is shown theoretically to produce a gain in the scattered intensity of 10-10³ (depending on the optical constants of the material) over that expected from a thick sample using the conventional Raman backscattering configuration. The potential of the method is demonstrated experimentally using tellurium, and a gain of 20 is obtained.

Original language	English (US)
Pages (from-to)	31-33
Number of pages	3
Journal	Applied Physics Letters
Volume	36
Issue number	1
DOIs	https://doi.org/10.1063/1.91304
State	Published - Dec 1 1980
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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AB - A new method of obtaining Raman spectra from a very thin highly absorbing films (α≳105 cm-1) is described. The technique which is termed interference enhanced Raman scattering (IERS) is shown theoretically to produce a gain in the scattered intensity of 10-103 (depending on the optical constants of the material) over that expected from a thick sample using the conventional Raman backscattering configuration. The potential of the method is demonstrated experimentally using tellurium, and a gain of 20 is obtained.

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Interference enhanced Raman scattering from very thin absorbing films

Abstract

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