Interference enhanced Raman scattering from very thin absorbing films

G. A.N. Connell, R. J. Nemanich, C. C. Tsai

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Abstract

A new method of obtaining Raman spectra from a very thin highly absorbing films (α≳105 cm-1) is described. The technique which is termed interference enhanced Raman scattering (IERS) is shown theoretically to produce a gain in the scattered intensity of 10-103 (depending on the optical constants of the material) over that expected from a thick sample using the conventional Raman backscattering configuration. The potential of the method is demonstrated experimentally using tellurium, and a gain of 20 is obtained.

Original languageEnglish (US)
Pages (from-to)31-33
Number of pages3
JournalApplied Physics Letters
Volume36
Issue number1
DOIs
StatePublished - Dec 1 1980
Externally publishedYes

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ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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