Interfacial structure in silicon nitride sintered with lanthanide oxide

Christian Dwyer, A. Ziegler, N. Shibata, G. B. Winkelman, R. L. Satet, M. J. Hoffmann, M. K. Cinibulk, P. F. Becher, G. S. Painter, N. D. Browning, D. J H Cockayne, R. O. Ritchie, S. J. Pennycook

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

Three independent research groups present a comparison of their structural analyses of prismatic interfaces in silicon nitride densified with the aid of lanthanide oxide Ln2O3. All three groups obtained scanning transmission electron microscope images which clearly reveal the presence of well-defined Ln segregation sites at the interfaces, and, moreover, reveal that these segregation sites are element-specific. While some results differ across the three research groups, the vast majority exhibits good reproducibility.

Original languageEnglish (US)
Pages (from-to)4405-4412
Number of pages8
JournalJournal of Materials Science
Volume41
Issue number14
DOIs
StatePublished - Jul 2006
Externally publishedYes

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Lanthanoid Series Elements
Rare earth elements
Silicon nitride
silicon nitrides
Oxides
oxides
Electron microscopes
Scanning
electron microscopes
scanning
silicon nitride

ASJC Scopus subject areas

  • Materials Science(all)
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Dwyer, C., Ziegler, A., Shibata, N., Winkelman, G. B., Satet, R. L., Hoffmann, M. J., ... Pennycook, S. J. (2006). Interfacial structure in silicon nitride sintered with lanthanide oxide. Journal of Materials Science, 41(14), 4405-4412. https://doi.org/10.1007/s10853-006-0152-2

Interfacial structure in silicon nitride sintered with lanthanide oxide. / Dwyer, Christian; Ziegler, A.; Shibata, N.; Winkelman, G. B.; Satet, R. L.; Hoffmann, M. J.; Cinibulk, M. K.; Becher, P. F.; Painter, G. S.; Browning, N. D.; Cockayne, D. J H; Ritchie, R. O.; Pennycook, S. J.

In: Journal of Materials Science, Vol. 41, No. 14, 07.2006, p. 4405-4412.

Research output: Contribution to journalArticle

Dwyer, C, Ziegler, A, Shibata, N, Winkelman, GB, Satet, RL, Hoffmann, MJ, Cinibulk, MK, Becher, PF, Painter, GS, Browning, ND, Cockayne, DJH, Ritchie, RO & Pennycook, SJ 2006, 'Interfacial structure in silicon nitride sintered with lanthanide oxide', Journal of Materials Science, vol. 41, no. 14, pp. 4405-4412. https://doi.org/10.1007/s10853-006-0152-2
Dwyer C, Ziegler A, Shibata N, Winkelman GB, Satet RL, Hoffmann MJ et al. Interfacial structure in silicon nitride sintered with lanthanide oxide. Journal of Materials Science. 2006 Jul;41(14):4405-4412. https://doi.org/10.1007/s10853-006-0152-2
Dwyer, Christian ; Ziegler, A. ; Shibata, N. ; Winkelman, G. B. ; Satet, R. L. ; Hoffmann, M. J. ; Cinibulk, M. K. ; Becher, P. F. ; Painter, G. S. ; Browning, N. D. ; Cockayne, D. J H ; Ritchie, R. O. ; Pennycook, S. J. / Interfacial structure in silicon nitride sintered with lanthanide oxide. In: Journal of Materials Science. 2006 ; Vol. 41, No. 14. pp. 4405-4412.
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