Interfacial structure in silicon nitride sintered with lanthanide oxide

C. Dwyer; A. Ziegler; N. Shibata; G. B. Winkelman; R. L. Satet; M. J. Hoffmann; M. K. Cinibulk; P. F. Becher; G. S. Painter; N. D. Browning; D. J.H. Cockayne; R. O. Ritchie; S. J. Pennycook

doi:10.1007/s10853-006-0152-2

Interfacial structure in silicon nitride sintered with lanthanide oxide

C. Dwyer, A. Ziegler, N. Shibata, G. B. Winkelman, R. L. Satet, M. J. Hoffmann, M. K. Cinibulk, P. F. Becher, G. S. Painter, N. D. Browning, D. J.H. Cockayne, R. O. Ritchie, S. J. Pennycook

CLAS-NS: Physics

Research output: Contribution to journal › Article

19 Scopus citations

Abstract

Three independent research groups present a comparison of their structural analyses of prismatic interfaces in silicon nitride densified with the aid of lanthanide oxide Ln₂O₃. All three groups obtained scanning transmission electron microscope images which clearly reveal the presence of well-defined Ln segregation sites at the interfaces, and, moreover, reveal that these segregation sites are element-specific. While some results differ across the three research groups, the vast majority exhibits good reproducibility.

Original language	English (US)
Pages (from-to)	4405-4412
Number of pages	8
Journal	Journal of Materials Science
Volume	41
Issue number	14
DOIs	https://doi.org/10.1007/s10853-006-0152-2
State	Published - Jul 1 2006

Fingerprint

ASJC Scopus subject areas

Materials Science(all)
Mechanics of Materials
Mechanical Engineering

Cite this

Dwyer, C., Ziegler, A., Shibata, N., Winkelman, G. B., Satet, R. L., Hoffmann, M. J., Cinibulk, M. K., Becher, P. F., Painter, G. S., Browning, N. D., Cockayne, D. J. H., Ritchie, R. O., & Pennycook, S. J. (2006). Interfacial structure in silicon nitride sintered with lanthanide oxide. Journal of Materials Science, 41(14), 4405-4412. https://doi.org/10.1007/s10853-006-0152-2

Interfacial structure in silicon nitride sintered with lanthanide oxide. / Dwyer, C.; Ziegler, A.; Shibata, N.; Winkelman, G. B.; Satet, R. L.; Hoffmann, M. J.; Cinibulk, M. K.; Becher, P. F.; Painter, G. S.; Browning, N. D.; Cockayne, D. J.H.; Ritchie, R. O.; Pennycook, S. J.

In: Journal of Materials Science, Vol. 41, No. 14, 01.07.2006, p. 4405-4412.

Research output: Contribution to journal › Article

@article{63a71026a1d44b6b98d68a52892d3d99,

title = "Interfacial structure in silicon nitride sintered with lanthanide oxide",

abstract = "Three independent research groups present a comparison of their structural analyses of prismatic interfaces in silicon nitride densified with the aid of lanthanide oxide Ln2O3. All three groups obtained scanning transmission electron microscope images which clearly reveal the presence of well-defined Ln segregation sites at the interfaces, and, moreover, reveal that these segregation sites are element-specific. While some results differ across the three research groups, the vast majority exhibits good reproducibility.",

author = "C. Dwyer and A. Ziegler and N. Shibata and Winkelman, {G. B.} and Satet, {R. L.} and Hoffmann, {M. J.} and Cinibulk, {M. K.} and Becher, {P. F.} and Painter, {G. S.} and Browning, {N. D.} and Cockayne, {D. J.H.} and Ritchie, {R. O.} and Pennycook, {S. J.}",

year = "2006",

month = jul

day = "1",

doi = "10.1007/s10853-006-0152-2",

language = "English (US)",

volume = "41",

pages = "4405--4412",

journal = "Journal of Materials Science",

issn = "0022-2461",

publisher = "Springer Netherlands",

number = "14",

}

TY - JOUR

T1 - Interfacial structure in silicon nitride sintered with lanthanide oxide

AU - Dwyer, C.

AU - Ziegler, A.

AU - Shibata, N.

AU - Winkelman, G. B.

AU - Satet, R. L.

AU - Hoffmann, M. J.

AU - Cinibulk, M. K.

AU - Becher, P. F.

AU - Painter, G. S.

AU - Browning, N. D.

AU - Cockayne, D. J.H.

AU - Ritchie, R. O.

AU - Pennycook, S. J.

PY - 2006/7/1

Y1 - 2006/7/1

N2 - Three independent research groups present a comparison of their structural analyses of prismatic interfaces in silicon nitride densified with the aid of lanthanide oxide Ln2O3. All three groups obtained scanning transmission electron microscope images which clearly reveal the presence of well-defined Ln segregation sites at the interfaces, and, moreover, reveal that these segregation sites are element-specific. While some results differ across the three research groups, the vast majority exhibits good reproducibility.

AB - Three independent research groups present a comparison of their structural analyses of prismatic interfaces in silicon nitride densified with the aid of lanthanide oxide Ln2O3. All three groups obtained scanning transmission electron microscope images which clearly reveal the presence of well-defined Ln segregation sites at the interfaces, and, moreover, reveal that these segregation sites are element-specific. While some results differ across the three research groups, the vast majority exhibits good reproducibility.

UR - http://www.scopus.com/inward/record.url?scp=33747126798&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33747126798&partnerID=8YFLogxK

U2 - 10.1007/s10853-006-0152-2

DO - 10.1007/s10853-006-0152-2

M3 - Article

AN - SCOPUS:33747126798

VL - 41

SP - 4405

EP - 4412

JO - Journal of Materials Science

JF - Journal of Materials Science

SN - 0022-2461

IS - 14

ER -

Access to Document

10.1007/s10853-006-0152-2