Abstract
Three independent research groups present a comparison of their structural analyses of prismatic interfaces in silicon nitride densified with the aid of lanthanide oxide Ln2O3. All three groups obtained scanning transmission electron microscope images which clearly reveal the presence of well-defined Ln segregation sites at the interfaces, and, moreover, reveal that these segregation sites are element-specific. While some results differ across the three research groups, the vast majority exhibits good reproducibility.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 4405-4412 |
| Number of pages | 8 |
| Journal | Journal of Materials Science |
| Volume | 41 |
| Issue number | 14 |
| DOIs | |
| State | Published - Jul 2006 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
Cite this
Interfacial structure in silicon nitride sintered with lanthanide oxide. / Dwyer, Christian; Ziegler, A.; Shibata, N.; Winkelman, G. B.; Satet, R. L.; Hoffmann, M. J.; Cinibulk, M. K.; Becher, P. F.; Painter, G. S.; Browning, N. D.; Cockayne, D. J H; Ritchie, R. O.; Pennycook, S. J.
In: Journal of Materials Science, Vol. 41, No. 14, 07.2006, p. 4405-4412.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Interfacial structure in silicon nitride sintered with lanthanide oxide
AU - Dwyer, Christian
AU - Ziegler, A.
AU - Shibata, N.
AU - Winkelman, G. B.
AU - Satet, R. L.
AU - Hoffmann, M. J.
AU - Cinibulk, M. K.
AU - Becher, P. F.
AU - Painter, G. S.
AU - Browning, N. D.
AU - Cockayne, D. J H
AU - Ritchie, R. O.
AU - Pennycook, S. J.
PY - 2006/7
Y1 - 2006/7
N2 - Three independent research groups present a comparison of their structural analyses of prismatic interfaces in silicon nitride densified with the aid of lanthanide oxide Ln2O3. All three groups obtained scanning transmission electron microscope images which clearly reveal the presence of well-defined Ln segregation sites at the interfaces, and, moreover, reveal that these segregation sites are element-specific. While some results differ across the three research groups, the vast majority exhibits good reproducibility.
AB - Three independent research groups present a comparison of their structural analyses of prismatic interfaces in silicon nitride densified with the aid of lanthanide oxide Ln2O3. All three groups obtained scanning transmission electron microscope images which clearly reveal the presence of well-defined Ln segregation sites at the interfaces, and, moreover, reveal that these segregation sites are element-specific. While some results differ across the three research groups, the vast majority exhibits good reproducibility.
UR - http://www.scopus.com/inward/record.url?scp=33747126798&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33747126798&partnerID=8YFLogxK
U2 - 10.1007/s10853-006-0152-2
DO - 10.1007/s10853-006-0152-2
M3 - Article
AN - SCOPUS:33747126798
VL - 41
SP - 4405
EP - 4412
JO - Journal of Materials Science
JF - Journal of Materials Science
SN - 0022-2461
IS - 14
ER -