Interface structures in beta-silicon carbide thin films

Steven R. Nutt, David Smith, H. J. Kim, Robert F. Davis

    Research output: Contribution to journalArticlepeer-review

    70 Scopus citations

    Abstract

    Interface structures in monocrystalline beta-silicon carbide thin films grown on (001) silicon substrates have been studied by high-resolution electron microscopy of cross-sectional specimens. Despite a large lattice mismatch, there is a periodic registry of {111} atom planes across the SiC-Si interface. Planar defects on SiC {111} planes are grown-in and arise primarily from lattice and thermal expansion mismatch. Thermal oxidation in wet atmospheres results in preferential attack of the SiC film at sites where planar defects intersect the film surface, whereas oxidation in dry atmospheres does not.

    Original languageEnglish (US)
    Pages (from-to)203-205
    Number of pages3
    JournalApplied Physics Letters
    Volume50
    Issue number4
    DOIs
    StatePublished - 1987

    ASJC Scopus subject areas

    • Physics and Astronomy (miscellaneous)

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