Interface kinetics at metal contacts on a-Si

H

Robert Nemanich, M. J. Thompson, Warren B. Jackson, C. C. Tsai, B. L. Stafford

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

The structural interactions at the interface of Cr, Ni, Pd on doped and undoped a-Si:H are measured using interference enhanced Raman scattering. The electrical properties of the barriers are probed by J-V and internal photoemission. After atomic interactions occur the J-V characteristics become nearly ideal while the internal photoemission signal increases but shows no change in barrier height.

Original languageEnglish (US)
Pages (from-to)513-516
Number of pages4
JournalJournal of Non-Crystalline Solids
Volume59-60
Issue numberPART 1
DOIs
StatePublished - 1983
Externally publishedYes

Fingerprint

Photoemission
electric contacts
photoelectric emission
Metals
atomic interactions
Kinetics
kinetics
metals
Raman scattering
Electric properties
electrical properties
Raman spectra
interference
interactions

ASJC Scopus subject areas

  • Ceramics and Composites
  • Electronic, Optical and Magnetic Materials
  • Engineering(all)

Cite this

Nemanich, R., Thompson, M. J., Jackson, W. B., Tsai, C. C., & Stafford, B. L. (1983). Interface kinetics at metal contacts on a-Si: H. Journal of Non-Crystalline Solids, 59-60(PART 1), 513-516. https://doi.org/10.1016/0022-3093(83)90633-6

Interface kinetics at metal contacts on a-Si : H. / Nemanich, Robert; Thompson, M. J.; Jackson, Warren B.; Tsai, C. C.; Stafford, B. L.

In: Journal of Non-Crystalline Solids, Vol. 59-60, No. PART 1, 1983, p. 513-516.

Research output: Contribution to journalArticle

Nemanich, R, Thompson, MJ, Jackson, WB, Tsai, CC & Stafford, BL 1983, 'Interface kinetics at metal contacts on a-Si: H', Journal of Non-Crystalline Solids, vol. 59-60, no. PART 1, pp. 513-516. https://doi.org/10.1016/0022-3093(83)90633-6
Nemanich, Robert ; Thompson, M. J. ; Jackson, Warren B. ; Tsai, C. C. ; Stafford, B. L. / Interface kinetics at metal contacts on a-Si : H. In: Journal of Non-Crystalline Solids. 1983 ; Vol. 59-60, No. PART 1. pp. 513-516.
@article{dfa3c01b457b43b2ac562788b4929099,
title = "Interface kinetics at metal contacts on a-Si: H",
abstract = "The structural interactions at the interface of Cr, Ni, Pd on doped and undoped a-Si:H are measured using interference enhanced Raman scattering. The electrical properties of the barriers are probed by J-V and internal photoemission. After atomic interactions occur the J-V characteristics become nearly ideal while the internal photoemission signal increases but shows no change in barrier height.",
author = "Robert Nemanich and Thompson, {M. J.} and Jackson, {Warren B.} and Tsai, {C. C.} and Stafford, {B. L.}",
year = "1983",
doi = "10.1016/0022-3093(83)90633-6",
language = "English (US)",
volume = "59-60",
pages = "513--516",
journal = "Journal of Non-Crystalline Solids",
issn = "0022-3093",
publisher = "Elsevier",
number = "PART 1",

}

TY - JOUR

T1 - Interface kinetics at metal contacts on a-Si

T2 - H

AU - Nemanich, Robert

AU - Thompson, M. J.

AU - Jackson, Warren B.

AU - Tsai, C. C.

AU - Stafford, B. L.

PY - 1983

Y1 - 1983

N2 - The structural interactions at the interface of Cr, Ni, Pd on doped and undoped a-Si:H are measured using interference enhanced Raman scattering. The electrical properties of the barriers are probed by J-V and internal photoemission. After atomic interactions occur the J-V characteristics become nearly ideal while the internal photoemission signal increases but shows no change in barrier height.

AB - The structural interactions at the interface of Cr, Ni, Pd on doped and undoped a-Si:H are measured using interference enhanced Raman scattering. The electrical properties of the barriers are probed by J-V and internal photoemission. After atomic interactions occur the J-V characteristics become nearly ideal while the internal photoemission signal increases but shows no change in barrier height.

UR - http://www.scopus.com/inward/record.url?scp=0020947862&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0020947862&partnerID=8YFLogxK

U2 - 10.1016/0022-3093(83)90633-6

DO - 10.1016/0022-3093(83)90633-6

M3 - Article

VL - 59-60

SP - 513

EP - 516

JO - Journal of Non-Crystalline Solids

JF - Journal of Non-Crystalline Solids

SN - 0022-3093

IS - PART 1

ER -