Interband transitions of crystalline and amorphous SiO2: An electron energy-loss spectroscopy (EELS) study of the low-loss region

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45 Scopus citations

Abstract

Surface and bulk low-loss spectra of α-quartz (c-SiO2), SiO2 glass (am-SiO2) and opal were studied by electron energy-loss spectroscopy (EELS) with a transmission electron microscope (TEM). Four interband transitions with similar energies occur in all samples. These transitions were investigated by comparison with published optical data and with the valence and joint density of states calculated by the pseudopotential method. The interband transitions arise from maxima in the valence-band density of states.

Original languageEnglish (US)
Pages (from-to)303-307
Number of pages5
JournalSolid State Communications
Volume106
Issue number5
DOIs
StatePublished - May 1998

Keywords

  • A. insulators
  • D. dielectric response
  • E. electron energy loss spectroscopy
  • Electronic band structure

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

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