Integrated X-ray L absorption spectra. Counting holes in Ni complexes

Hongxin Wang, Pinghua Ge, C. G. Riordan, S. Brooker, C. G. Woomer, T. Collins, C. A. Melendres, O. Graudejus, N. Bartlett, S. P. Cramer

Research output: Contribution to journalArticle

44 Scopus citations

Abstract

Despite the fact that chemists frequently draw electron density distributions, there are few good methods for measuring this quantity, which has contributed to many longstanding controversies in chemistry. In this paper, we report the first application of element specific L absorption spectra and the "white light" sum rule to a series of nickel complexes, with wide oxidation state range from NiI to NiIV. Nickel L edge X-ray absorption spectroscopy is turning out to be an excellent quantitative probe of 3d-vacancies.

Original languageEnglish (US)
Pages (from-to)8343-8346
Number of pages4
JournalJournal of Physical Chemistry B
Volume102
Issue number42
DOIs
StatePublished - Oct 15 1998

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Integrated X-ray L absorption spectra. Counting holes in Ni complexes'. Together they form a unique fingerprint.

  • Cite this

    Wang, H., Ge, P., Riordan, C. G., Brooker, S., Woomer, C. G., Collins, T., Melendres, C. A., Graudejus, O., Bartlett, N., & Cramer, S. P. (1998). Integrated X-ray L absorption spectra. Counting holes in Ni complexes. Journal of Physical Chemistry B, 102(42), 8343-8346. https://doi.org/10.1021/jp9821026