Integrated circuit identification and true random numbers using 1.5-transistor flash memory

Lawrence T. Clark, James Adams, Keith Holbert

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

Flash memory bits, like other integrated circuit (IC) devices, are prone to random variability in their actual vs. nominal characteristics. We present the use of 1.5-T flash memory cells in physically unclonable functions (PUFs) leveraging their erase speed variability. This type of memory is interesting for the internet of things (IOT) due to its wide availability as IP at foundries. Using experimentally measured results, we show simple methods that provide high reliability with no or limited need for helper data and error correction. High quality fingerprints for IC identification are demonstrated. Moreover, techniques to remove systematic variations from the array response are shown, allowing the resulting binary strings to pass all National Institute of Standards and Technology tests for randomness. Consequently, with low complexity helper functions, true random numbers can be readily produced.

Original languageEnglish (US)
Title of host publicationProceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017
PublisherIEEE Computer Society
Pages244-249
Number of pages6
ISBN (Electronic)9781509054046
DOIs
StatePublished - May 2 2017
Event18th International Symposium on Quality Electronic Design, ISQED 2017 - Santa Clara, United States
Duration: Mar 14 2017Mar 15 2017

Other

Other18th International Symposium on Quality Electronic Design, ISQED 2017
CountryUnited States
CitySanta Clara
Period3/14/173/15/17

Keywords

  • flash memory
  • physically unclonable functions
  • systematic mismatch
  • True random number generation

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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