INSTRUMENTAL LIMITATIONS AND CURRENT PROSPECTS FOR MATERIALS RESEARCH WITH THE LATEST GENERATION OF HIGH-RESOLUTION ELECTRON MICROSCOPES.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The macroscopic properties of most materials depend directly on their microstructure and its local variability at the atomic level. Recent trends in high resolution electron microscopes (HREMs) have led to resolving powers on this scale, which in turn has made these instruments invaluable to many materials science investigations. The purposes of this short review are firstly to outline some of the fundamentals of high resolution image formation and interpretation and then to summarise some of the latest instrumental developments.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposia Proceedings
Place of PublicationPittsburgh, PA, USA
PublisherMaterials Research Soc
Pages3-12
Number of pages10
Volume41
ISBN (Print)0931837065
StatePublished - 1985
Externally publishedYes

Fingerprint

Optical resolving power
Electron microscopes
Materials science
Image processing
Microstructure

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Smith, D. (1985). INSTRUMENTAL LIMITATIONS AND CURRENT PROSPECTS FOR MATERIALS RESEARCH WITH THE LATEST GENERATION OF HIGH-RESOLUTION ELECTRON MICROSCOPES. In Materials Research Society Symposia Proceedings (Vol. 41, pp. 3-12). Pittsburgh, PA, USA: Materials Research Soc.

INSTRUMENTAL LIMITATIONS AND CURRENT PROSPECTS FOR MATERIALS RESEARCH WITH THE LATEST GENERATION OF HIGH-RESOLUTION ELECTRON MICROSCOPES. / Smith, David.

Materials Research Society Symposia Proceedings. Vol. 41 Pittsburgh, PA, USA : Materials Research Soc, 1985. p. 3-12.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Smith, D 1985, INSTRUMENTAL LIMITATIONS AND CURRENT PROSPECTS FOR MATERIALS RESEARCH WITH THE LATEST GENERATION OF HIGH-RESOLUTION ELECTRON MICROSCOPES. in Materials Research Society Symposia Proceedings. vol. 41, Materials Research Soc, Pittsburgh, PA, USA, pp. 3-12.
Smith D. INSTRUMENTAL LIMITATIONS AND CURRENT PROSPECTS FOR MATERIALS RESEARCH WITH THE LATEST GENERATION OF HIGH-RESOLUTION ELECTRON MICROSCOPES. In Materials Research Society Symposia Proceedings. Vol. 41. Pittsburgh, PA, USA: Materials Research Soc. 1985. p. 3-12
Smith, David. / INSTRUMENTAL LIMITATIONS AND CURRENT PROSPECTS FOR MATERIALS RESEARCH WITH THE LATEST GENERATION OF HIGH-RESOLUTION ELECTRON MICROSCOPES. Materials Research Society Symposia Proceedings. Vol. 41 Pittsburgh, PA, USA : Materials Research Soc, 1985. pp. 3-12
@inproceedings{3f5aa705088a49399a2c4fe89addcfdf,
title = "INSTRUMENTAL LIMITATIONS AND CURRENT PROSPECTS FOR MATERIALS RESEARCH WITH THE LATEST GENERATION OF HIGH-RESOLUTION ELECTRON MICROSCOPES.",
abstract = "The macroscopic properties of most materials depend directly on their microstructure and its local variability at the atomic level. Recent trends in high resolution electron microscopes (HREMs) have led to resolving powers on this scale, which in turn has made these instruments invaluable to many materials science investigations. The purposes of this short review are firstly to outline some of the fundamentals of high resolution image formation and interpretation and then to summarise some of the latest instrumental developments.",
author = "David Smith",
year = "1985",
language = "English (US)",
isbn = "0931837065",
volume = "41",
pages = "3--12",
booktitle = "Materials Research Society Symposia Proceedings",
publisher = "Materials Research Soc",

}

TY - GEN

T1 - INSTRUMENTAL LIMITATIONS AND CURRENT PROSPECTS FOR MATERIALS RESEARCH WITH THE LATEST GENERATION OF HIGH-RESOLUTION ELECTRON MICROSCOPES.

AU - Smith, David

PY - 1985

Y1 - 1985

N2 - The macroscopic properties of most materials depend directly on their microstructure and its local variability at the atomic level. Recent trends in high resolution electron microscopes (HREMs) have led to resolving powers on this scale, which in turn has made these instruments invaluable to many materials science investigations. The purposes of this short review are firstly to outline some of the fundamentals of high resolution image formation and interpretation and then to summarise some of the latest instrumental developments.

AB - The macroscopic properties of most materials depend directly on their microstructure and its local variability at the atomic level. Recent trends in high resolution electron microscopes (HREMs) have led to resolving powers on this scale, which in turn has made these instruments invaluable to many materials science investigations. The purposes of this short review are firstly to outline some of the fundamentals of high resolution image formation and interpretation and then to summarise some of the latest instrumental developments.

UR - http://www.scopus.com/inward/record.url?scp=0022264895&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0022264895&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0022264895

SN - 0931837065

VL - 41

SP - 3

EP - 12

BT - Materials Research Society Symposia Proceedings

PB - Materials Research Soc

CY - Pittsburgh, PA, USA

ER -