Innovative Design for Test in State-of-the-Art Analog Systems

Hans Martin Von Staudt; Amit Majumdar; Bill Taylor; Jennifer Kitchen

doi:10.1109/VTS.2019.8758607

Innovative Design for Test in State-of-the-Art Analog Systems

Hans Martin Von Staudt, Amit Majumdar, Bill Taylor, Jennifer Kitchen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

There is a growing demand for low-cost and effective test solutions to support state-of-the-art analog and mixed-signal systems that are continuously increasing in complexity and functionality, while decreasing in product cost. This innovative practice session highlights various aspects of design for test (DfT) in high-complexity, analog-dominated systems with three talks that focus on: DfT in power management integrated circuits (ICs), an alternative testing method to analog test bus, and pre-silicon built-in self-test (BIST) verification, where BIST is used to monitor complex mixed-signal systems. These talks will be given by industry experts from Dialog Semiconductor, Xilinx, and Texas Instruments.

Original language	English (US)
Title of host publication	2019 IEEE 37th VLSI Test Symposium, VTS 2019
Publisher	IEEE Computer Society
ISBN (Electronic)	9781728111704
DOIs	https://doi.org/10.1109/VTS.2019.8758607
State	Published - Apr 2019
Event	37th IEEE VLSI Test Symposium, VTS 2019 - Monterey, United States Duration: Apr 23 2019 → Apr 25 2019

Publication series

Name	Proceedings of the IEEE VLSI Test Symposium
Volume	2019-April

Conference

Conference	37th IEEE VLSI Test Symposium, VTS 2019
Country/Territory	United States
City	Monterey
Period	4/23/19 → 4/25/19

ASJC Scopus subject areas

Computer Science Applications
Electrical and Electronic Engineering

Access to Document

10.1109/VTS.2019.8758607

Cite this

Von Staudt, HM, Majumdar, A, Taylor, B & Kitchen, J 2019, Innovative Design for Test in State-of-the-Art Analog Systems. in 2019 IEEE 37th VLSI Test Symposium, VTS 2019., 8758607, Proceedings of the IEEE VLSI Test Symposium, vol. 2019-April, IEEE Computer Society, 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, United States, 4/23/19. https://doi.org/10.1109/VTS.2019.8758607

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Innovative Design for Test in State-of-the-Art Analog Systems

Abstract

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ASJC Scopus subject areas

Access to Document

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