Innovative Design for Test in State-of-the-Art Analog Systems

Hans Martin Von Staudt, Amit Majumdar, Bill Taylor, Jennifer Kitchen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

There is a growing demand for low-cost and effective test solutions to support state-of-the-art analog and mixed-signal systems that are continuously increasing in complexity and functionality, while decreasing in product cost. This innovative practice session highlights various aspects of design for test (DfT) in high-complexity, analog-dominated systems with three talks that focus on: DfT in power management integrated circuits (ICs), an alternative testing method to analog test bus, and pre-silicon built-in self-test (BIST) verification, where BIST is used to monitor complex mixed-signal systems. These talks will be given by industry experts from Dialog Semiconductor, Xilinx, and Texas Instruments.

Original languageEnglish (US)
Title of host publication2019 IEEE 37th VLSI Test Symposium, VTS 2019
PublisherIEEE Computer Society
ISBN (Electronic)9781728111704
DOIs
StatePublished - Apr 1 2019
Event37th IEEE VLSI Test Symposium, VTS 2019 - Monterey, United States
Duration: Apr 23 2019Apr 25 2019

Publication series

NameProceedings of the IEEE VLSI Test Symposium
Volume2019-April

Conference

Conference37th IEEE VLSI Test Symposium, VTS 2019
CountryUnited States
CityMonterey
Period4/23/194/25/19

Fingerprint

Signal systems
Built-in self test
Integrated circuits
Costs
Semiconductor materials
Silicon
Testing
Industry
Power management

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Von Staudt, H. M., Majumdar, A., Taylor, B., & Kitchen, J. (2019). Innovative Design for Test in State-of-the-Art Analog Systems. In 2019 IEEE 37th VLSI Test Symposium, VTS 2019 [8758607] (Proceedings of the IEEE VLSI Test Symposium; Vol. 2019-April). IEEE Computer Society. https://doi.org/10.1109/VTS.2019.8758607

Innovative Design for Test in State-of-the-Art Analog Systems. / Von Staudt, Hans Martin; Majumdar, Amit; Taylor, Bill; Kitchen, Jennifer.

2019 IEEE 37th VLSI Test Symposium, VTS 2019. IEEE Computer Society, 2019. 8758607 (Proceedings of the IEEE VLSI Test Symposium; Vol. 2019-April).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Von Staudt, HM, Majumdar, A, Taylor, B & Kitchen, J 2019, Innovative Design for Test in State-of-the-Art Analog Systems. in 2019 IEEE 37th VLSI Test Symposium, VTS 2019., 8758607, Proceedings of the IEEE VLSI Test Symposium, vol. 2019-April, IEEE Computer Society, 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, United States, 4/23/19. https://doi.org/10.1109/VTS.2019.8758607
Von Staudt HM, Majumdar A, Taylor B, Kitchen J. Innovative Design for Test in State-of-the-Art Analog Systems. In 2019 IEEE 37th VLSI Test Symposium, VTS 2019. IEEE Computer Society. 2019. 8758607. (Proceedings of the IEEE VLSI Test Symposium). https://doi.org/10.1109/VTS.2019.8758607
Von Staudt, Hans Martin ; Majumdar, Amit ; Taylor, Bill ; Kitchen, Jennifer. / Innovative Design for Test in State-of-the-Art Analog Systems. 2019 IEEE 37th VLSI Test Symposium, VTS 2019. IEEE Computer Society, 2019. (Proceedings of the IEEE VLSI Test Symposium).
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