Inner shell edge profiles in electron energy loss spectroscopy

Channing C. Ahn, Peter Rez

Research output: Contribution to journalArticle

54 Scopus citations

Abstract

Inner shell edge profiles for K, L and M edges that are most likely to be used in microanalysis have been calculated using Hartree-Slater wave functions and are compared to experimental data. The aim is to identify those features that are not predicted by a one-electron atomic theory and to get some estimate of the accuracy of quantitative analysis using these calculations. In general, the fit between theory and experiment is quite good for those edges which do not have maxima delayed by more than 40 eV. In addition, solid state effects are averaged out if large (100 eV) integration windows are used. Accuracy can be improved in the transition metals and the rare earths by excluding the "white line" portion of the spectrum in any comparison.

Original languageEnglish (US)
Pages (from-to)105-115
Number of pages11
JournalUltramicroscopy
Volume17
Issue number2
DOIs
StatePublished - 1985
Externally publishedYes

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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