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Dive into the research topics of 'Influence of stacking faults on the properties of GaN-based UV light-emitting diodes grown on non-polar substrates'. Together they form a unique fingerprint.- Sort by
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C. Q. Chen, V. Adivarahan, M. Shatalov, M. E. Gaevski, E. Kuokstis, J. W. Yang, H. P. Maruska, Z. Gong, M. Asif Khan, R. Liu, A. Bell, Fernando Ponce
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution