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INFLUENCE OF INTERFACIAL STRUCTURE ON THE ELECTRONIC PROPERTIES OF SiO2/InP MISFET`s.
K. M. Geib, S. M. Goodnick, D. Y. Lin, R. G. Gann, C. W. Wilmsen, J. F. Wager
Research output: Contribution to journal › Conference article › peer-review
18
Scopus
citations