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Influence of Cu diffusion conditions on the switching of Cu-SiO2-based resistive memory devices
S. Puthen Thermadam, S. K. Bhagat, Terry Alford, Y. Sakaguchi, Michael Kozicki, M. Mitkova
- Materials Science and Engineering
- Mechanical and Aerospace Engineering
- Chemical Engineering
- Connection One (C1)
- Knowledge Enterprise (KE)
- Engineering of Matter, Transport and Energy, School for (IAFSE-SEMTE)
- Solid State Electronics Research Center (CSSER)
- Electrical Engineering
- Nano-Electronics, Arizona Institute of (AINE)
- Applied Nanoionics, Center for (CANi)
- Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)
- Engineering, Ira A. Fulton Schools of (IAFSE)
Research output: Contribution to journal › Article › peer-review
67
Scopus
citations