TY - GEN
T1 - Inexpensive Indoor Spot-cell and Spot-light Methods for Angle of Incidence Measurements of PV Modules
AU - Amou, Komi Apelete
AU - Hammond, Zachary
AU - Javalkar, Vibhesh
AU - Tamizhmani, Govindasamy
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/6/14
Y1 - 2020/6/14
N2 - Various testing methods have been explored in the past to study the effect of the angle of incidence (AOI) on the short-circuit current (Isc), and hence the power, of a photovoltaic module. In this paper, we are presenting two simple methods for determining the effect of AOI on the short-circuit current, namely the spot-cell method applied on the 1-cell module and the spot-light method applied on the full-size commercial module. The purpose of this work is to design and establish an inexpensive but accurate indoor test setup that can be used by the industry to obtain AOI curves for a cell or a module. This paper provides details on the construction and operation of the test setup. The AOI curves obtained in this work have been compared and validated using the AOI curves obtained as per IEC 61853-2 standard. This paper presents AOI results obtained on crystalline silicon cells and modules with glass superstrates, with and without anti-soiling coatings, and with and without artificially deposited soil layers.
AB - Various testing methods have been explored in the past to study the effect of the angle of incidence (AOI) on the short-circuit current (Isc), and hence the power, of a photovoltaic module. In this paper, we are presenting two simple methods for determining the effect of AOI on the short-circuit current, namely the spot-cell method applied on the 1-cell module and the spot-light method applied on the full-size commercial module. The purpose of this work is to design and establish an inexpensive but accurate indoor test setup that can be used by the industry to obtain AOI curves for a cell or a module. This paper provides details on the construction and operation of the test setup. The AOI curves obtained in this work have been compared and validated using the AOI curves obtained as per IEC 61853-2 standard. This paper presents AOI results obtained on crystalline silicon cells and modules with glass superstrates, with and without anti-soiling coatings, and with and without artificially deposited soil layers.
KW - angle of incidence
KW - spot-Light method
KW - spot-cell method
UR - http://www.scopus.com/inward/record.url?scp=85099530392&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85099530392&partnerID=8YFLogxK
U2 - 10.1109/PVSC45281.2020.9300578
DO - 10.1109/PVSC45281.2020.9300578
M3 - Conference contribution
AN - SCOPUS:85099530392
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 2406
EP - 2411
BT - 2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 47th IEEE Photovoltaic Specialists Conference, PVSC 2020
Y2 - 15 June 2020 through 21 August 2020
ER -