Abstract
Chemists and mineralogists often have to elucidate the crystal structure of new materials even when conventional X-ray methods are not applicable. If, for example, long-range order is not extensive or the amount of material available for examination is minute (<10-7 g) the classical techniques of X-ray or neutron diffraction cannot be used. In such circumstances, direct structural determination using high resolution electron microscopy is, in principle, possible. To achieve worthwhile information, however, a point-to-point resolution of 2.8 Å or better is desirable, if the structural details of most oxides, halides, chalcogenides and various oxysalts of metallic and semi-metallic elements are to be established. We demonstrate here how high voltage, high resolution electron microscopy confirms the struc ture of a representative silicate mineral, showing the potential of the technique for the elucidation of locally abnormal (at the subunit cell level) structures.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 51-52 |
| Number of pages | 2 |
| Journal | Nature |
| Volume | 281 |
| Issue number | 5726 |
| DOIs | |
| State | Published - 1979 |
| Externally published | Yes |
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Cite this
Individual silicate chains in wollastonite by high resolution electron microscopy [4]. / Jefferson, D. A.; Thomas, J. M.; Smith, David; Camps, R. A.; Catto, C. J D; Cleaver, J. R A.
In: Nature, Vol. 281, No. 5726, 1979, p. 51-52.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Individual silicate chains in wollastonite by high resolution electron microscopy [4]
AU - Jefferson, D. A.
AU - Thomas, J. M.
AU - Smith, David
AU - Camps, R. A.
AU - Catto, C. J D
AU - Cleaver, J. R A
PY - 1979
Y1 - 1979
N2 - Chemists and mineralogists often have to elucidate the crystal structure of new materials even when conventional X-ray methods are not applicable. If, for example, long-range order is not extensive or the amount of material available for examination is minute (<10-7 g) the classical techniques of X-ray or neutron diffraction cannot be used. In such circumstances, direct structural determination using high resolution electron microscopy is, in principle, possible. To achieve worthwhile information, however, a point-to-point resolution of 2.8 Å or better is desirable, if the structural details of most oxides, halides, chalcogenides and various oxysalts of metallic and semi-metallic elements are to be established. We demonstrate here how high voltage, high resolution electron microscopy confirms the struc ture of a representative silicate mineral, showing the potential of the technique for the elucidation of locally abnormal (at the subunit cell level) structures.
AB - Chemists and mineralogists often have to elucidate the crystal structure of new materials even when conventional X-ray methods are not applicable. If, for example, long-range order is not extensive or the amount of material available for examination is minute (<10-7 g) the classical techniques of X-ray or neutron diffraction cannot be used. In such circumstances, direct structural determination using high resolution electron microscopy is, in principle, possible. To achieve worthwhile information, however, a point-to-point resolution of 2.8 Å or better is desirable, if the structural details of most oxides, halides, chalcogenides and various oxysalts of metallic and semi-metallic elements are to be established. We demonstrate here how high voltage, high resolution electron microscopy confirms the struc ture of a representative silicate mineral, showing the potential of the technique for the elucidation of locally abnormal (at the subunit cell level) structures.
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U2 - 10.1038/281051a0
DO - 10.1038/281051a0
M3 - Article
AN - SCOPUS:0009999625
VL - 281
SP - 51
EP - 52
JO - Nature
JF - Nature
SN - 0028-0836
IS - 5726
ER -