Increasing the exchange-bias field of Ni0.5Co0.5O films by microstructural control

Dinesh Martien, Kentaro Takano, A. E. Berkowitz, David Smith

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

The exchange-bias field produced by antiferromagnetic monoxide films has been shown to scale with the density of uncompensated interfacial spins. The uncompensated spin density is inversely proportional to the interfacial grain diameter. Accordingly, we have prepared Ni0.5Co0.5O films in which the average interfacial grain diameter is small, but the grains are elongated, thus avoiding thermally activated fluctuations of the spin system associated with small grain volumes. The exchange-bias field remained inversely proportional to the interfacial grain diameter, and was increased to twice its previous maximum value without introducing significant thermal instability.

Original languageEnglish (US)
Pages (from-to)1314-1316
Number of pages3
JournalApplied Physics Letters
Volume74
Issue number9
StatePublished - Mar 1 1999

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ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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Increasing the exchange-bias field of Ni0.5Co0.5O films by microstructural control. / Martien, Dinesh; Takano, Kentaro; Berkowitz, A. E.; Smith, David.

In: Applied Physics Letters, Vol. 74, No. 9, 01.03.1999, p. 1314-1316.

Research output: Contribution to journalArticle

Martien, D, Takano, K, Berkowitz, AE & Smith, D 1999, 'Increasing the exchange-bias field of Ni0.5Co0.5O films by microstructural control', Applied Physics Letters, vol. 74, no. 9, pp. 1314-1316.
Martien, Dinesh ; Takano, Kentaro ; Berkowitz, A. E. ; Smith, David. / Increasing the exchange-bias field of Ni0.5Co0.5O films by microstructural control. In: Applied Physics Letters. 1999 ; Vol. 74, No. 9. pp. 1314-1316.
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