Incorporation of a frequency-dependent dielectric response for the barrier material in the josephson junction circuit model

Chemical Compounds

• Metal Insulator Transition 100%
• Dielectric Response 99%
• Quasiparticle 55%
• Compound Mobility 53%
• Voltage 50%
• Conductivity 46%
• Plasma 43%
• Phonon 39%
• Dissipation 38%
• Semiconductor 26%
• Resistance 22%

Engineering & Materials Science

• Superconducting materials 91%
• Metal insulator transition 66%
• Networks (circuits) 38%
• Plasmas 32%
• Phonons 27%
• Electric potential 27%
• Defects 23%
• Scattering 16%
• Semiconductor materials 15%
• Dynamic response 15%

Physics & Astronomy

• Josephson junctions 72%
• plasma frequencies 19%
• electric potential 14%
• insulators 12%
• conductivity 11%
• elementary excitations 9%
• defects 9%
• barrier layers 9%
• dynamic response 9%
• metals 8%
• integers 8%
• methodology 7%
• dissipation 7%
• anomalies 7%
• phonons 5%
• predictions 4%
• scattering 4%
• excitation 4%