Incorporating RF test measurements for efficient design flow of GaN-based power amplifiers

Richard Welker, Sule Ozev, Jennifer Kitchen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

When designing an RF circuit using advanced non-CMOS device technologies, such as GaN (Gallium Nitride), component models are not always available or the provided models do not cover the operating conditions (frequency, bias, etc.) necessary for the application. Compact analytical models are also not available for these devices, and device sizes and bias conditions do not scale in the same way as CMOS devices. As a result, designers often need additional characterization steps to ensure that the utilized models are an accurate representation of the actual device behavior. In this paper, we present a design flow that incorporates RF tests that focus on design specific measurements. The goal is to minimize the number of these time-consuming measurements during the design process by utilizing interpolation between points in the design space that have already been explored and by initiating a new measurement only when exploring a point in the design space that falls far from all previously explored points. The design process is demonstrated in simulation on a GaN power amplifier (PA) that yields 42.9 dBm of signal power with only 0.5 dB of gain compression, 27.4 dB power gain, 28.3 % power added efficiency (PAE) and operates at a center frequency of 36 GHz.

Original languageEnglish (US)
Title of host publicationPAWR 2018 - Proceedings 2018 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages69-71
Number of pages3
Volume2018-January
ISBN (Electronic)9781538612897
DOIs
StatePublished - Mar 8 2018
Event2018 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications, PAWR 2018 - Anaheim, United States
Duration: Jan 14 2018Jan 17 2018

Other

Other2018 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications, PAWR 2018
CountryUnited States
CityAnaheim
Period1/14/181/17/18

Keywords

  • Design Flow
  • GaN
  • Modeling
  • Power Amplifiers
  • RF Test

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Instrumentation

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    Welker, R., Ozev, S., & Kitchen, J. (2018). Incorporating RF test measurements for efficient design flow of GaN-based power amplifiers. In PAWR 2018 - Proceedings 2018 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications (Vol. 2018-January, pp. 69-71). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PAWR.2018.8310070