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In situ tensile testing of tin (Sn) whiskers in a focused ion beam (FIB)/scanning electron microscope (SEM)
Renuka Vallabhaneni, Ehsa Izadi, Carl R. Mayer, C. Shashank Kaira, Sudhanshu S. Singh, Jagannathan Rajagopalan, Nikhilesh Chawla
Research output: Contribution to journal › Article › peer-review
10
Scopus
citations