In situ micropillar compression of Al/SiC nanolaminates using laboratory-based nanoscale X-ray microscopy: Effect of nanopores on mechanical behavior

Somya Singh, C. Shashank Kaira, Hrishikesh Bale, Chuong Huynh, Arno Merkle, Nikhilesh Chawla

Research output: Contribution to journalArticle

Abstract

In situ studies using X-ray tomography have gained immense popularity in the recent past owing to their non-destructive nature and ability to capture the microstructure of a wide range of materials in 3D. In this work, we have conducted in situ micropillar compression and studied damage evolution in Al/SiC nanolaminates using a laboratory-based nanoscale X-ray microscope. Nanoscale defects present in the microstructure were characterized in 3D. The effect of these nanopores on damage initiation was quantified and is discussed. Additionally, the effect of Ga + ion milling on micropillar fabrication was characterized by performing a comparative experiment on pillars fabricated using Ga + and Ne + ion source based focused ion beams.

Original languageEnglish (US)
Pages (from-to)207-212
Number of pages6
JournalMaterials Characterization
Volume150
DOIs
StatePublished - Apr 1 2019

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Keywords

  • Focused ion beam
  • In situ micropillar compression
  • Nanocomposites
  • Sputtering

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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