In situ measurements of plagioclase growth using SIMS depth profiles of 7Li/30Si: A means to acquire crystallization rates during short-duration decompression events

Kimberly Genareau, Amanda Clarke

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Fingerprint

Dive into the research topics of 'In situ measurements of plagioclase growth using SIMS depth profiles of <sup>7</sup>Li/<sup>30</sup>Si: A means to acquire crystallization rates during short-duration decompression events'. Together they form a unique fingerprint.

Physics & Astronomy

Earth & Environmental Sciences

Chemical Compounds