In-situ characterization of 2D potential distributions in biased Si n+-p junctions using off-axis electron holography

M. Han, T. Hirayama, David Smith, Martha McCartney

Research output: Contribution to journal › Article › peer-review

Fingerprint

Dive into the research topics of 'In-situ characterization of 2D potential distributions in biased Si n+-p junctions using off-axis electron holography'. Together they form a unique fingerprint.