In-situ characterization of 2D potential distributions in biased Si n+-p junctions using off-axis electron holography

M. Han, T. Hirayama, David Smith, Martha McCartney

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)400-401
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 1 2008

ASJC Scopus subject areas

  • Instrumentation

Cite this