Abstract
The total polarization fields of pseudomorphic In xGa 1-xN/GaN and Al xGa 1-xN/GaN heterostructures with 0≤x≤0.4 have been calculated as a function of the crystal orientation. Especial attention is placed on the direction and magnitude of in-plane piezoelectric polarization, which is not negligible for the nonpolar and semi-polar growth. For an arbitrary crystal orientation, the piezoelectric polarization prevails in the InGaN/GaN system while the spontaneous polarization prevails in the AlGaN/GaN system. The in-plane potential due to polarization fields in non-polar epilayers is found to depend on the degree of planarity of the heterojunctions, and on the respective lateral dimensions.
Original language | English (US) |
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Pages (from-to) | 2226-2232 |
Number of pages | 7 |
Journal | Physica Status Solidi (A) Applications and Materials Science |
Volume | 207 |
Issue number | 10 |
DOIs | |
State | Published - Oct 2010 |
Keywords
- III-V semiconductors
- Non-polar growth
- Piezoelectric polarization
- Spontaneous polarization
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering
- Materials Chemistry