In-Plane Optical Anisotropy and Linear Dichroism in Low-Symmetry Layered TlSe

Shengxue Yang, Chunguang Hu, Minghui Wu, Wanfu Shen, Sefaattin Tongay, Kedi Wu, Bin Wei, Zhaoyang Sun, Chengbao Jiang, Li Huang, Zhongchang Wang

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

In-plane anisotropy of layered materials adds another dimension to their applications, opening up avenues in diverse angle-resolved devices. However, to fulfill a strong inherent in-plane anisotropy in layered materials still poses a significant challenge as it often requires a low-symmetry nature of layered materials. Here, we report the fabrication of a member of layered semiconducting AIIIBVI compounds TlSe which possesses a low-symmetry tetragonal structure, and investigate its anisotropic light-matter interactions. We first identify the in-plane Raman-intensity anisotropy of thin-layer TlSe, offering unambiguous evidence that the anisotropy is sensitive to crystalline orientation. Further in-situ azimuth-dependent reflectance difference microscopy enables to directly evaluate in-plane optical anisotropy of layered TlSe and we demonstrate that the TlSe shows a linear dichroism under polarized absorption spectra arising from in-plane anisotropic optical property. As a direct result of the linear dichroism, we successfully fabricate TlSe devices for polarization-sensitive photodetection. The discovery of layered TlSe with a strong in-plane anisotropy not only facilitates its applications in linear dichroic photodetection, but opens up more possibilities for other functional device applications.

Original languageEnglish (US)
JournalACS Nano
DOIs
StateAccepted/In press - Jan 1 2018

Fingerprint

Optical anisotropy
Dichroism
dichroism
Anisotropy
anisotropy
symmetry
Crystal orientation
Absorption spectra
Microscopic examination
azimuth
Optical properties
Polarization
Crystalline materials
Fabrication
microscopy
absorption spectra
reflectance
optical properties
fabrication
polarization

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

In-Plane Optical Anisotropy and Linear Dichroism in Low-Symmetry Layered TlSe. / Yang, Shengxue; Hu, Chunguang; Wu, Minghui; Shen, Wanfu; Tongay, Sefaattin; Wu, Kedi; Wei, Bin; Sun, Zhaoyang; Jiang, Chengbao; Huang, Li; Wang, Zhongchang.

In: ACS Nano, 01.01.2018.

Research output: Contribution to journalArticle

Yang, S, Hu, C, Wu, M, Shen, W, Tongay, S, Wu, K, Wei, B, Sun, Z, Jiang, C, Huang, L & Wang, Z 2018, 'In-Plane Optical Anisotropy and Linear Dichroism in Low-Symmetry Layered TlSe', ACS Nano. https://doi.org/10.1021/acsnano.8b05162
Yang, Shengxue ; Hu, Chunguang ; Wu, Minghui ; Shen, Wanfu ; Tongay, Sefaattin ; Wu, Kedi ; Wei, Bin ; Sun, Zhaoyang ; Jiang, Chengbao ; Huang, Li ; Wang, Zhongchang. / In-Plane Optical Anisotropy and Linear Dichroism in Low-Symmetry Layered TlSe. In: ACS Nano. 2018.
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