@inproceedings{f70e65efbf7142aca95322a0891d4384,
title = "In-Flight Demonstration of Enhanced-Low-Dose-Rate-Sensitivity (ELDRS) in Bipolar Junction Transistors",
abstract = "Data on bipolar junction transistors (BJTs) acquired from an in-flight mission experiment are recorded and downloaded for analysis. These data are analyzed for the purpose of characterizing the effects of low dose rate space irradiation on BJTs using a simulated PNP model that has been shown to accurately represent real-life effects of temperature on base current degradation. Results are compared to ground-based tests and show similar trends to LDR ground-based tests. These results will be used for validating recommended hardness assurance test methods for Enhanced-Low-Dose-Rate-Sensitivity (ELDRS) in the space environments and to gain insight into ELDRS mechanisms and the effects of the complex real space environment on BJTs.",
author = "Benedetto, {A. R.} and Barnaby, {H. J.} and Cheyenne Cook and Campola, {Michael J.} and Anna Tender",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 2022 IEEE Aerospace Conference, AERO 2022 ; Conference date: 05-03-2022 Through 12-03-2022",
year = "2022",
doi = "10.1109/AERO53065.2022.9843335",
language = "English (US)",
series = "IEEE Aerospace Conference Proceedings",
publisher = "IEEE Computer Society",
booktitle = "2022 IEEE Aerospace Conference, AERO 2022",
}