Improving Analog Switching in HfOx-Based Resistive Memory with a Thermal Enhanced Layer

Wei Wu, Huaqiang Wu, Bin Gao, Ning Deng, Shimeng Yu, He Qian

Research output: Contribution to journalArticlepeer-review

91 Scopus citations

Abstract

Analog RRAM with hundreds of resistance levels is an attractive device for neuromorphic computing. However, it is still very challenging to realize good analog behavior in filamentary RRAM cells. In this letter, we developed a novel methodology to improve the analog switching in filamentary RRAM. The impact of local temperature on analog switching behavior is elucidated. The transition from abrupt switching to analog switching is found at higher temperature. Based on this result, a thermal enhanced layer (TEL) is proposed to confine heat in switching layer for realizing analog RRAM. The HfOx/TEL RRAM shows analog switching characteristics with more than ten times window using 50-ns pulses. Finally, a 1-kb analog RRAM array is demonstrated with uniform analog switching, fast speed, excellent resistance window, and excellent retention properties.

Original languageEnglish (US)
Article number7956170
Pages (from-to)1019-1022
Number of pages4
JournalIEEE Electron Device Letters
Volume38
Issue number8
DOIs
StatePublished - Aug 2017

Keywords

  • Analog RRAM
  • neuromorphic computing
  • synapse

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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