Abstract
Insulation of transformer windings can be damaged by the impulse voltages of high amplitude produced by lightning or switching transients. Testing of the windings insulation is performed by using the standard impulse test, generally applying the fast Fourier transform (FFT) algorithm to analyze the transformer 'fingerprint' in frequency domain. However, FFT analysis is limited by the spectral leakage and degradation at spectral peaks. To obtain a better signature analysis, this paper investigates the use of power spectral density (PSD) and wavelets analysis techniques. Experimental results are shown from different tests with windings under normal and turn-to-turn short circuit conditions in a single phase transformer.
Original language | English (US) |
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Title of host publication | Proceedings of the IEEE Power Engineering Society Transmission and Distribution Conference |
Pages | 2412-2416 |
Number of pages | 5 |
Volume | 4 |
State | Published - 2000 |
Event | Proceedings of the 2000 Power Engineering Society Summer Meeting - Seattle, WA, United States Duration: Jul 16 2000 → Jul 20 2000 |
Other
Other | Proceedings of the 2000 Power Engineering Society Summer Meeting |
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Country/Territory | United States |
City | Seattle, WA |
Period | 7/16/00 → 7/20/00 |
Keywords
- Power spectral density
- Signature analysis
- Transformer
- Wavelets
ASJC Scopus subject areas
- Engineering(all)
- Energy(all)