Improved surface morphology and texture of Ag films on indium tin oxide via Cu additions

H. Han, Yeongseok Zoo, J. W. Mayer, Terry Alford

Research output: Contribution to journalArticle

12 Scopus citations

Abstract

The surface and texture properties of Ag(Cu) alloy thin films on indium tin oxide (ITO) has been investigated and compared to pure Ag thin films on ITO. Atomic force microscopy (AFM) and x-ray diffraction results of annealed films show differences in the evolution of surface morphology and texture with annealing. The presence of Cu atoms in the silver alters the alloy's surface energy and surface diffusion. This results in Ag and Ag(Cu) alloy having the very different surface morphology and crystallographic texture. The (111) texture of the Ag(Cu) is enhanced when compared to that of pure Ag films. The resistivity of Ag(Cu) films annealed at high temperatures (∼up to 600 °C for 1 h in vacuum) remained constant due to absence of agglomeration.

Original languageEnglish (US)
Article number036101
JournalJournal of Applied Physics
Volume102
Issue number3
DOIs
StatePublished - Aug 24 2007

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Improved surface morphology and texture of Ag films on indium tin oxide via Cu additions'. Together they form a unique fingerprint.

  • Cite this