Improved Measurement of the π → eν Branching Ratio

A. Aguilar-Arevalo, M. Aoki, M. Blecher, D. I. Britton, D. A. Bryman, D. Vom Bruch, S. Chen, J. Comfort, M. Ding, L. Doria, S. Cuen-Rochin, P. Gumplinger, A. Hussein, Y. Igarashi, S. Ito, S. H. Kettell, L. Kurchaninov, L. S. Littenberg, C. Malbrunot, R. E. MischkeT. Numao, D. Protopopescu, A. Sher, T. Sullivan, D. Vavilov, K. Yamada

Research output: Contribution to journalArticlepeer-review

43 Scopus citations

Abstract

A new measurement of the branching ratio Re/μ=Γ(π+→e+ν+π+→e+νγ)/Γ(π+→μ+ν+π+→μ+νγ) resulted in Re/μexp=[1.2344±0.0023(stat)±0.0019(syst)]×10-4. This is in agreement with the standard model prediction and improves the test of electron-muon universality to the level of 0.1%.

Original languageEnglish (US)
Article number071801
JournalPhysical Review Letters
Volume115
Issue number7
DOIs
StatePublished - Aug 13 2015

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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