Improved circuits for microchip identification using SRAM mismatch

Srivatsan Chellappa, Aritra Dey, Lawrence T. Clark

Research output: Chapter in Book/Report/Conference proceedingConference contribution

16 Scopus citations

Abstract

Integrated circuit authentication requires identification using un-clonable digital fingerprints. SRAM power-up state is one such fingerprinting method. In this paper we present a new, more robust hardware technique for generating secret keys and unique serial numbers using SRAM cells' inherent mismatch due to process variations in the constituent transistors. The improved method can be used in operation and is amenable to devices using power-up BIST. It is experimentally demonstrated and analyzed on a 90 nm test chip.

Original languageEnglish (US)
Title of host publication2011 IEEE Custom Integrated Circuits Conference, CICC 2011
DOIs
StatePublished - Nov 9 2011
Event33rd Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2011 - San Jose, CA, United States
Duration: Sep 19 2011Sep 21 2011

Publication series

NameProceedings of the Custom Integrated Circuits Conference
ISSN (Print)0886-5930

Other

Other33rd Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2011
CountryUnited States
CitySan Jose, CA
Period9/19/119/21/11

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Improved circuits for microchip identification using SRAM mismatch'. Together they form a unique fingerprint.

  • Cite this

    Chellappa, S., Dey, A., & Clark, L. T. (2011). Improved circuits for microchip identification using SRAM mismatch. In 2011 IEEE Custom Integrated Circuits Conference, CICC 2011 [6055318] (Proceedings of the Custom Integrated Circuits Conference). https://doi.org/10.1109/CICC.2011.6055318