Improved accuracy thin film permeability extraction for a microstrip permeameter

Tom Sebastian, Sergio A. Clavijo, Rodolfo Diaz

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

It is shown using full-wave simulations that several of the conventional assumptions made for extracting permeability data from a microstrip permeameter are not justified. In particular, the proportionality between the measured effective permeability in the device and the true permeability of the film is not a constant. It is a function of the permeability of the film, its geometry and the dimensions of the microstrip permeameter. A model exploiting the analyticity of the function relating effective to true permeability is used to derive this proportionality function for our device and the results are confirmed using full-wave simulations. The error incurred by not using this method and employing a reference sample for calibration or by using saturation magnetization "Ms" and anisotropy field "Ha" is shown to be anywhere between 5% and 40% and possibly even more. Our measurement set up is capable of measuring films as thin as 300 nm with a relative permeability as low as 10.

Original languageEnglish (US)
Article number033906
JournalJournal of Applied Physics
Volume113
Issue number3
DOIs
StatePublished - Jan 21 2013

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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