Implied-V _oc and Suns-V _oc measurements in multicrystalline solar cells

Identifying loss mechanisms and predicting device performance are key goals of device and process characterization. Photoconductance measurements allow the extraction of the Implied V _oc and Suns V _oc, which together can be used for process monitoring, for loss analysis and to identify the potential device performance in the absence of unwanted defects. In this paper, we measure the Implied V _oc and Suns V _oc from solar cells with a range of different substrates and at different stages in processing. These measurements are used to analyze the correlation with the actual V _oc to determine the impact of both non-idealities such as depletion region recombination, and expected effects such as lifetime changes, both during processing and in the final devices.