Implied-V oc and Suns-V oc measurements in multicrystalline solar cells

Stuart Bowden, V. Yelundur, A. Rohatgi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

19 Scopus citations


Identifying loss mechanisms and predicting device performance are key goals of device and process characterization. Photoconductance measurements allow the extraction of the Implied V oc and Suns V oc, which together can be used for process monitoring, for loss analysis and to identify the potential device performance in the absence of unwanted defects. In this paper, we measure the Implied V oc and Suns V oc from solar cells with a range of different substrates and at different stages in processing. These measurements are used to analyze the correlation with the actual V oc to determine the impact of both non-idealities such as depletion region recombination, and expected effects such as lifetime changes, both during processing and in the final devices.

Original languageEnglish (US)
Title of host publicationConference Record of the IEEE Photovoltaic Specialists Conference
Number of pages4
StatePublished - 2002
Externally publishedYes
Event29th IEEE Photovoltaic Specialists Conference - New Orleans, LA, United States
Duration: May 19 2002May 24 2002


Other29th IEEE Photovoltaic Specialists Conference
Country/TerritoryUnited States
CityNew Orleans, LA

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Condensed Matter Physics


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