TY - JOUR
T1 - Implantation and ion beam mixing in thin film analysis
AU - Williams, Peter
AU - Baker, Judith E.
N1 - Funding Information:
We thank D.A. Reed for critical commentosn the manuscriptW. ork at the Universityo f Illinois was supportedb y the NationalS cienceF oundationu nder the MIlL Grant DMR-77-23999a nd,in part, by the Office of Nav',dR esearch(L .R. Cooper).
PY - 1981
Y1 - 1981
N2 - In thin film analyses obtained using sputtering techniques, primary ion implantation and ion beam mixing effects frequently produce significant alteration of the substrate before it can be sampled by the sputtering front. The present state of qualitative and quantitative understanding of these effects is discussed, with particular reference to: ion yield matrix effects and interface transients in secondary ion mass spectrometry, reduction of overlayer sputter rates due to ion beam mixing, the role of ion beam mixing in preferential sputtering, and the use of ion beam mixing to allow quantitative analysis of interfacial layers.
AB - In thin film analyses obtained using sputtering techniques, primary ion implantation and ion beam mixing effects frequently produce significant alteration of the substrate before it can be sampled by the sputtering front. The present state of qualitative and quantitative understanding of these effects is discussed, with particular reference to: ion yield matrix effects and interface transients in secondary ion mass spectrometry, reduction of overlayer sputter rates due to ion beam mixing, the role of ion beam mixing in preferential sputtering, and the use of ion beam mixing to allow quantitative analysis of interfacial layers.
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U2 - 10.1016/0029-554X(81)90667-4
DO - 10.1016/0029-554X(81)90667-4
M3 - Article
AN - SCOPUS:4243733293
SN - 0029-554X
VL - 182-183
SP - 15
EP - 24
JO - Nuclear Instruments and Methods
JF - Nuclear Instruments and Methods
IS - PART 1
ER -