@article{87a144235e234eb0937fc487143e1a63,
title = "Impact of VCO topology on SET induced frequency response",
abstract = "Laser experiments performed on two SiGe voltage controlled oscillator (VCO) circuit topologies show different output spectrums. Analytical models demonstrate that spectral response is determined by design features that impact modulated amplitude or frequency characteristic of transient signals. Further analysis of the two circuits shows the DC bias condition dependence on the topology during laser strikes, which is the main cause of the frequency and amplitude modulation of the transient output signal.",
keywords = "Amplitude modulation, Frequency modulation, Phase noise, Single-event transients, Voltage-controlled oscillator (VCO)",
author = "Wenjian Chen and Niha Varanasi and Vincent Pouget and Hugh Barnaby and Bert Vermeire and Adell, {Philippe C.} and Tino Copani and Pascal Fouillat",
note = "Funding Information: Manuscript received July 20, 2006; revised September 4, 2007. This work was supported by the NASA SiGe and Advanced Mixed Signal Radiation Effects Program and DARPA RHBD Program. W. Chen, N. Varanasi, H. J. Barnaby, B. Vermeire, and T. Copani are with Arizona State University, Tempe, AZ 85287 USA (e-mail: wenjian.chen@asu. edu). V. Pouget and P. Fouillat are with IMS Laboratory, 33405 Talence, France (e-mail: vincent.pouget@ims-bordeaus.fr). P. C. Adell is with Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA 91109-8099 USA (e-mail: philippe.c.adell@jpl.nasa. gov). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TNS.2007.911422 Fig. 1. Output spectrum of SiGe HBT VCO (a) before laser strike and (b) during laser beam strikes reported in [2], the additional frequency contents on the left of the main carrier during laser strikes for case (b) can mix with the noise at the corresponding frequencies to the signal band and lower the signal to noise ratio (SNR).",
year = "2007",
month = dec,
doi = "10.1109/TNS.2007.911422",
language = "English (US)",
volume = "54",
pages = "2500--2505",
journal = "IEEE Transactions on Nuclear Science",
issn = "0018-9499",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6",
}