Impact of switched dose-rate irradiation on the response of the LM124 operational amplifier to pulsed X-rays

Nicolas J.H. Roche; Laurent Dusseau; Julien Mekki; Stephanie Perez; Jean Roch Vaillé; Yago Gonzalez Velo; Jérome Boch; Frédéric Saigné; Ronan Marec; Philippe Calvel; Francoise Bezerra; Gérard Auriel; Bruno Azaïs; Stephen P. Buchner

doi:10.1109/TNS.2011.2136360

Impact of switched dose-rate irradiation on the response of the LM124 operational amplifier to pulsed X-rays

Nicolas J.H. Roche, Laurent Dusseau, Julien Mekki, Stephanie Perez, Jean Roch Vaillé, Yago Gonzalez Velo, Jérome Boch, Frédéric Saigné, Ronan Marec, Philippe Calvel, Francoise Bezerra, Gérard Auriel, Bruno Azaïs, Stephen P. Buchner

Research output: Contribution to journal › Article › peer-review

20 Scopus citations

Abstract

The Synergistic effect between TID and ATREEs (Analog Transient Radiation Effects on Electronics) in an operational amplifier (opamp) (LM124) is investigated for three different bias configurations. An accelerated irradiation technique is used to study these synergistic effects. The impact of TID on ATREEs is found to be identical regardless of whether the irradiation is performed at low dose rate or whether the dose rate is switched from high to low using the Dose Rate Switching (DRS) technique. The correlation between the deviations of the opamp's electrical parameters and the changes of ATREE widths is clearly established.

Original language	English (US)
Article number	5759111
Pages (from-to)	960-968
Number of pages	9
Journal	IEEE Transactions on Nuclear Science
Volume	58
Issue number	3 PART 2
DOIs	https://doi.org/10.1109/TNS.2011.2136360
State	Published - Jun 2011
Externally published	Yes

Keywords

Analog circuits
bipolar circuits
integrated circuit radiation effects
ionizing dose
single event transients
total dose effects
transient radiation effects
transient response
x-ray effects

ASJC Scopus subject areas

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

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10.1109/TNS.2011.2136360

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Roche, N. J. H., Dusseau, L., Mekki, J., Perez, S., Vaillé, J. R., Gonzalez Velo, Y., Boch, J., Saigné, F., Marec, R., Calvel, P., Bezerra, F., Auriel, G., Azaïs, B., & Buchner, S. P. (2011). Impact of switched dose-rate irradiation on the response of the LM124 operational amplifier to pulsed X-rays. IEEE Transactions on Nuclear Science, 58(3 PART 2), 960-968. Article 5759111. https://doi.org/10.1109/TNS.2011.2136360

Roche, NJH, Dusseau, L, Mekki, J, Perez, S, Vaillé, JR, Gonzalez Velo, Y, Boch, J, Saigné, F, Marec, R, Calvel, P, Bezerra, F, Auriel, G, Azaïs, B & Buchner, SP 2011, 'Impact of switched dose-rate irradiation on the response of the LM124 operational amplifier to pulsed X-rays', IEEE Transactions on Nuclear Science, vol. 58, no. 3 PART 2, 5759111, pp. 960-968. https://doi.org/10.1109/TNS.2011.2136360

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title = "Impact of switched dose-rate irradiation on the response of the LM124 operational amplifier to pulsed X-rays",

abstract = "The Synergistic effect between TID and ATREEs (Analog Transient Radiation Effects on Electronics) in an operational amplifier (opamp) (LM124) is investigated for three different bias configurations. An accelerated irradiation technique is used to study these synergistic effects. The impact of TID on ATREEs is found to be identical regardless of whether the irradiation is performed at low dose rate or whether the dose rate is switched from high to low using the Dose Rate Switching (DRS) technique. The correlation between the deviations of the opamp's electrical parameters and the changes of ATREE widths is clearly established.",

keywords = "Analog circuits, bipolar circuits, integrated circuit radiation effects, ionizing dose, single event transients, total dose effects, transient radiation effects, transient response, x-ray effects",

author = "Roche, {Nicolas J.H.} and Laurent Dusseau and Julien Mekki and Stephanie Perez and Vaill{\'e}, {Jean Roch} and {Gonzalez Velo}, Yago and J{\'e}rome Boch and Fr{\'e}d{\'e}ric Saign{\'e} and Ronan Marec and Philippe Calvel and Francoise Bezerra and G{\'e}rard Auriel and Bruno Aza{\"i}s and Buchner, {Stephen P.}",

note = "Funding Information: Manuscript received September 17, 2010; revised December 12, 2010; accepted March 24, 2011. Date of publication April 29, 2011; date of current version June 15, 2011. This work was supported in part by the Direction G{\'e}n{\'e}rale de l{\textquoteright}Armement, the Centre National d{\textquoteright}Etudes Spatiales and Thales Alenia Space.",

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doi = "10.1109/TNS.2011.2136360",

language = "English (US)",

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AU - Roche, Nicolas J.H.

AU - Dusseau, Laurent

AU - Mekki, Julien

AU - Perez, Stephanie

AU - Vaillé, Jean Roch

AU - Gonzalez Velo, Yago

AU - Boch, Jérome

AU - Saigné, Frédéric

AU - Marec, Ronan

AU - Calvel, Philippe

AU - Bezerra, Francoise

AU - Auriel, Gérard

AU - Azaïs, Bruno

AU - Buchner, Stephen P.

N1 - Funding Information: Manuscript received September 17, 2010; revised December 12, 2010; accepted March 24, 2011. Date of publication April 29, 2011; date of current version June 15, 2011. This work was supported in part by the Direction Générale de l’Armement, the Centre National d’Etudes Spatiales and Thales Alenia Space.

PY - 2011/6

Y1 - 2011/6

N2 - The Synergistic effect between TID and ATREEs (Analog Transient Radiation Effects on Electronics) in an operational amplifier (opamp) (LM124) is investigated for three different bias configurations. An accelerated irradiation technique is used to study these synergistic effects. The impact of TID on ATREEs is found to be identical regardless of whether the irradiation is performed at low dose rate or whether the dose rate is switched from high to low using the Dose Rate Switching (DRS) technique. The correlation between the deviations of the opamp's electrical parameters and the changes of ATREE widths is clearly established.

AB - The Synergistic effect between TID and ATREEs (Analog Transient Radiation Effects on Electronics) in an operational amplifier (opamp) (LM124) is investigated for three different bias configurations. An accelerated irradiation technique is used to study these synergistic effects. The impact of TID on ATREEs is found to be identical regardless of whether the irradiation is performed at low dose rate or whether the dose rate is switched from high to low using the Dose Rate Switching (DRS) technique. The correlation between the deviations of the opamp's electrical parameters and the changes of ATREE widths is clearly established.

KW - Analog circuits

KW - bipolar circuits

KW - integrated circuit radiation effects

KW - ionizing dose

KW - single event transients

KW - total dose effects

KW - transient radiation effects

KW - transient response

KW - x-ray effects

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Impact of switched dose-rate irradiation on the response of the LM124 operational amplifier to pulsed X-rays

Abstract

Keywords

ASJC Scopus subject areas

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