@inproceedings{c6e373a95b1a46e8b3b1b8a4fbebd471,
title = "Impact of substrate thickness on the surface passivation in high performance n-type solar cells",
abstract = "Recently, silicon solar cells surpassed 26% efficiency. This was a result of remarkable low surface saturation current density and high short-circuit current provided by the SHJ-IBC architecture. In this paper we study the contribution of the different recombination mechanisms to shape the voltage at open-circuit and maximum power for different solar cell thicknesses. We demonstrate thinner cells are required to increase further the efficiency toward the intrinsic limit, as voltage increases and bulk lifetime dependence decreases. Open-circuit voltages over 760 mV were experimental confirmed on 50 μm-thick SHJ structures, leading to bandgap-voltage offsets of 0.349V.",
keywords = "amorphous materials, heterojunction, lifetime, photovoltaic, silicon, solar cells, surface passivation",
author = "Andre Augusto and Pradeep Balaji and Joseph Karas and Stuart Bowden",
note = "Funding Information: This material was based upon work supported by the U.S. Department of Energy through the Bay Area Photovoltaic Consortium under Award Number DE-EE0004946 and by the Engineering Research Center Program of the National Science Foundation and the Office of Energy Efficiency and Renewable Energy of the Department of Energy under NSF Cooperative Agreement No. EEC-1041895. Publisher Copyright: {\textcopyright} 2018 IEEE.; 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 ; Conference date: 10-06-2018 Through 15-06-2018",
year = "2018",
month = nov,
day = "26",
doi = "10.1109/PVSC.2018.8548174",
language = "English (US)",
series = "2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "2792--2794",
booktitle = "2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC",
}