Impact of on-chip interconnect frequency-dependent R(f)L(f) on digital and RF design

Yu Cao, Xuejue Huang, Dennis Sylvester, Tsu Jae King, Chenming Hu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Scopus citations

Abstract

On-chip interconnect exhibits clear frequency-dependence in both resistance and inductance. A compact ladder circuit model is developed to capture this behavior, and we examine its impact on digital and RF circuit design. It is demonstrated that the use of DC values for R and L is sufficient for delay analysis, but RL frequency dependence is critical for the analysis of signal integrity, shield line insertion, power supply stability, and RF inductor performance.

Original languageEnglish (US)
Title of host publicationProceedings - 15th Annual IEEE International ASIC/SOC Conference, ASIC/SOC 2002
EditorsJohn Chickanosky, Ram K. Krishnamurthy, P.R. Mukund
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages438-442
Number of pages5
ISBN (Electronic)0780374940
DOIs
StatePublished - Jan 1 2002
Externally publishedYes
Event15th Annual IEEE International ASIC/SOC Conference, ASIC/SOC 2002 - Rochester, United States
Duration: Sep 25 2002Sep 28 2002

Publication series

NameProceedings of the Annual IEEE International ASIC Conference and Exhibit
Volume2002-January
ISSN (Print)1063-0988

Other

Other15th Annual IEEE International ASIC/SOC Conference, ASIC/SOC 2002
CountryUnited States
CityRochester
Period9/25/029/28/02

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Cao, Y., Huang, X., Sylvester, D., King, T. J., & Hu, C. (2002). Impact of on-chip interconnect frequency-dependent R(f)L(f) on digital and RF design. In J. Chickanosky, R. K. Krishnamurthy, & P. R. Mukund (Eds.), Proceedings - 15th Annual IEEE International ASIC/SOC Conference, ASIC/SOC 2002 (pp. 438-442). [1158099] (Proceedings of the Annual IEEE International ASIC Conference and Exhibit; Vol. 2002-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ASIC.2002.1158099