Impact of hydrogen contamination on the total dose response of linear bipolar microcircuits

P. C. Adell, S. McClure, R. L. Pease, B. G. Rax, G. W. Dunham, Hugh Barnaby, X. J. Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

Abstract

Several linear bipolar microcircuits commonly used in space have been selected to investigate whether hydrogen contamination has an impact on their total dose response. Results obtained from irradiations performed on the HSYEl17 linear voltage regulator from Intersil and the AD590 temperature transducer from Analog Devices show a causal relationship between in-package hydrogen content and total dose response. Silicon nitride passivation has been found to play a key role in this study. A recommended approach to hardening bipolar linear circuits with poor total dose response is to characterize them as processed through metallization.

Original languageEnglish (US)
Title of host publication2007 9th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2007
DOIs
StatePublished - 2007
Event2007 9th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2007 - Deauville, France
Duration: Sep 10 2007Sep 14 2007

Publication series

NameProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Other

Other2007 9th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2007
CountryFrance
CityDeauville
Period9/10/079/14/07

Keywords

  • Enhanced low-dose rate sensitivity
  • Hydrogen
  • Linear regulator
  • Passivation
  • Radiation effects
  • Temperature transducer
  • Total ionizing dose

ASJC Scopus subject areas

  • Radiation
  • Electrical and Electronic Engineering

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