Impact of hydrogen contamination on the total dose response of linear bipolar microcircuits

P. C. Adell, S. McClure, R. L. Pease, B. G. Rax, G. W. Dunham, Hugh Barnaby, X. J. Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

Several linear bipolar microcircuits commonly used in space have been selected to investigate whether hydrogen contamination has an impact on their total dose response. Results obtained from irradiations performed on the HSYEl17 linear voltage regulator from Intersil and the AD590 temperature transducer from Analog Devices show a causal relationship between in-package hydrogen content and total dose response. Silicon nitride passivation has been found to play a key role in this study. A recommended approach to hardening bipolar linear circuits with poor total dose response is to characterize them as processed through metallization.

Original languageEnglish (US)
Title of host publicationProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
DOIs
StatePublished - 2007
Event2007 9th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2007 - Deauville, France
Duration: Sep 10 2007Sep 14 2007

Other

Other2007 9th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2007
CountryFrance
CityDeauville
Period9/10/079/14/07

Fingerprint

microelectronics
contamination
Contamination
dosage
Hydrogen
Voltage regulators
hydrogen
Metallizing
Silicon nitride
linear circuits
Passivation
voltage regulators
Dosimetry
Hardening
Transducers
Irradiation
silicon nitrides
hardening
passivity
Networks (circuits)

Keywords

  • Enhanced low-dose rate sensitivity
  • Hydrogen
  • Linear regulator
  • Passivation
  • Radiation effects
  • Temperature transducer
  • Total ionizing dose

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation

Cite this

Adell, P. C., McClure, S., Pease, R. L., Rax, B. G., Dunham, G. W., Barnaby, H., & Chen, X. J. (2007). Impact of hydrogen contamination on the total dose response of linear bipolar microcircuits. In Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS [5205490] https://doi.org/10.1109/RADECS.2007.5205490

Impact of hydrogen contamination on the total dose response of linear bipolar microcircuits. / Adell, P. C.; McClure, S.; Pease, R. L.; Rax, B. G.; Dunham, G. W.; Barnaby, Hugh; Chen, X. J.

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS. 2007. 5205490.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Adell, PC, McClure, S, Pease, RL, Rax, BG, Dunham, GW, Barnaby, H & Chen, XJ 2007, Impact of hydrogen contamination on the total dose response of linear bipolar microcircuits. in Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS., 5205490, 2007 9th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2007, Deauville, France, 9/10/07. https://doi.org/10.1109/RADECS.2007.5205490
Adell PC, McClure S, Pease RL, Rax BG, Dunham GW, Barnaby H et al. Impact of hydrogen contamination on the total dose response of linear bipolar microcircuits. In Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS. 2007. 5205490 https://doi.org/10.1109/RADECS.2007.5205490
Adell, P. C. ; McClure, S. ; Pease, R. L. ; Rax, B. G. ; Dunham, G. W. ; Barnaby, Hugh ; Chen, X. J. / Impact of hydrogen contamination on the total dose response of linear bipolar microcircuits. Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS. 2007.
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