Imaging scarred states in quantum dots

A. M. Burke, R. Akis, T. Day, G. Speyer, D. K. Ferry, B. R. Bennett

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

We have used the scanning gate microscopy technique to image scar structures in an open quantum dot, fabricated in an InAs quantum well and defined by electron beam lithography. These are shown to have a periodicity in magnetic field that correlates with that found in the conductance fluctuations. Simulations have shown that these magnetic transform images bear a strong resemblance to actual scars found in the dots.

Original languageEnglish (US)
Article number212201
JournalJournal of Physics Condensed Matter
Volume21
Issue number21
DOIs
StatePublished - 2009

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics

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